{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/16741"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/16741","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"Automating component-based testing from UML models","abstract":"Software components such as EJB’s or COM objects may be tested in an automated fashion with the help of UML models. First, these objects should be modeled in UML, using certain extensions and modeling conventions. Then, an automated software-testing program can read the UML diagrams and generate testing scripts which drive the components appropriately. EJBTest is such a program which can read UML diagrams of EJB’s and generate the appropriate Java code for testing those EJB’s. The generated scripts can successfully test the EJB’s for functionality and also perform database verification.","abstract_html":"Software components such as EJB’s or COM objects may be tested in an automated fashion with the help of UML models. First, these objects should be modeled in UML, using certain extensions and modeling conventions. Then, an automated software-testing program can read the UML diagrams and generate testing scripts which drive the components appropriately. EJBTest is such a program which can read UML diagrams of EJB’s and generate the appropriate Java code for testing those EJB’s. The generated scripts can successfully test the EJB’s for functionality and also perform database verification.","abstract_has_math":false,"creators":["Che, Bryan (Bryan Wan-Jen), 1977-"],"institution":"Massachusetts Institute of Technology","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.","school":null,"contributors":[],"advisors":["Daniel Jackson."],"committee_chairs":[],"committee_members":[],"year":2000,"date_issued":"2000","date_published":"2000","updated_at":"2026-07-22T22:22:10Z","subjects":["Electrical Engineering and Computer Science."],"languages":["eng"],"rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"rights_urls":["http://dspace.mit.edu/handle/1721.1/7582"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/1721.1/16741","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Daniel Jackson."]},{"key":"dc:contributor.department","label":"Department","values":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."]},{"key":"dc:contributor.other","label":"Dc Contributor Other","values":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."]},{"key":"dc:creator","label":"Author","values":["Che, Bryan (Bryan Wan-Jen), 1977-"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2005-05-19T14:25:54Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2005-05-19T14:25:54Z"]},{"key":"dc:date.issued","label":"Date","values":["2000"]},{"key":"dc:publisher","label":"Institution","values":["Massachusetts Institute of Technology"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Electrical Engineering and Computer Science."]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://dspace.mit.edu/handle/1721.1/7582"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/1721.1/16741"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Thesis (S.B. and M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.","Includes bibliographical references (leaf 43).","This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections."]},{"key":"dc:description.abstract","label":"Abstract","values":["Software components such as EJB’s or COM objects may be tested in an automated fashion with the help of UML models. First, these objects should be modeled in UML, using certain extensions and modeling conventions. Then, an automated software-testing program can read the UML diagrams and generate testing scripts which drive the components appropriately. EJBTest is such a program which can read UML diagrams of EJB’s and generate the appropriate Java code for testing those EJB’s. The generated scripts can successfully test the EJB’s for functionality and also perform database verification."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["S.B.and M.Eng."]},{"key":"dc:format.mimetype","label":"Dc Format Mimetype","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Automating component-based testing from UML models"]}]}],"canonical_facts":{"dc:contributor.advisor":["Daniel Jackson."],"dc:contributor.department":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."],"dc:contributor.other":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."],"dc:creator":["Che, Bryan (Bryan Wan-Jen), 1977-"],"dc:date.accessioned":["2005-05-19T14:25:54Z"],"dc:date.available":["2005-05-19T14:25:54Z"],"dc:date.issued":["2000"],"dc:description":["Thesis (S.B. and M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.","Includes bibliographical references (leaf 43).","This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections."],"dc:description.abstract":["Software components such as EJB’s or COM objects may be tested in an automated fashion with the help of UML models. First, these objects should be modeled in UML, using certain extensions and modeling conventions. Then, an automated software-testing program can read the UML diagrams and generate testing scripts which drive the components appropriately. EJBTest is such a program which can read UML diagrams of EJB’s and generate the appropriate Java code for testing those EJB’s. The generated scripts can successfully test the EJB’s for functionality and also perform database verification."],"dc:description.degree":["S.B.and M.Eng."],"dc:format.mimetype":["application/pdf"],"dc:identifier.uri":["http://hdl.handle.net/1721.1/16741"],"dc:language.iso":["eng"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"dc:rights.uri":["http://dspace.mit.edu/handle/1721.1/7582"],"dc:subject":["Electrical Engineering and Computer Science."],"dc:title":["Automating component-based testing from UML models"],"dc:type":["Thesis"]},"updated_at":"2026-07-22T22:22:10Z"}