Interdigital dielectrometry sensor design and parameter estimation algorithms for non-destructive materials evaluation

The major objective of this thesis is to develop instrumentation and parameter estimation algorithms for nondestructive measurement of non-homogeneous material property profiles with fringing electric field dielectrometry sensors. The instrumentation includes interdigital sensors and sensor arrays, other types of fringing field sensors, electronic circuit boards for measurement of sensor signals, and mechanical setups for specific applications. The parameter estimation algorithms require solving forward and inverse problems of material property estimation. The forward problem implies calculation of the sensor admittance matrix as a function of geometry and material properties. The inverse problem, inherently more difficult than the forward problem, implies estimation of unknown geometry and material properties based on known properties and measured entries of the sensor admittance matrix. The developed instrumentation and algorithms are applied to practical problems which include mo++

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

1999

Author dc:creator

• Mamishev, Alexander V., 1974-

Advisor dc:contributor.advisor

• Markus Zahn and Bernard C. Lesieutre.

• Electrical Engineering and Computer Science

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://theses.mit.edu:80/Dienst/UI/2.0/Describe/0018.mit.etheses%2f1999-9
• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/16729

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/16729