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Massachusetts Institute of Technology

Approximations to worst-case data dropping: unmasking failure modes

Abstract

dc:description.abstract

A data analyst might worry about generalization if dropping a very small fraction of data points from a study could change its substantive conclusions. Checking this non-robustness directly poses a combinatorial optimization problem and is intractable even for simple models and moderate data sizes. Recently various authors have proposed a diverse set of approximations to detect this non-robustness. In the present work, we show that, even in a setting as simple as ordinary least squares (OLS) linear regression, many of these approximations can fail to detect (true) non-robustness in realistic data arrangements. We focus on OLS in the present work due its widespread use and since some approximations work only for OLS. Of the approximations that do not fail our tests, we find not only that a simple recursive greedy algorithm is the most conceptually straightforward but also that it can be orders of magnitude faster to run than the others.

Degree

thesis:*
Name thesis:degree_name
Master
Department dc:contributor.department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2025

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Huang, Jenny Yijian
Advisor dc:contributor.advisor
  • Broderick, Tamara

Rights

dc:rights
Statement dc:rights
  • In Copyright - Educational Use Permitted
  • Copyright retained by author(s)

Identifiers

dc:identifier.*
Handle dc:identifier.uri
https://hdl.handle.net/1721.1/163699
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/163699

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Huang, Jenny Yijian. Approximations to worst-case data dropping: unmasking failure modes. Massachusetts Institute of Technology, 2025. https://hdl.handle.net/1721.1/163699