Transformation Tolerance of Facial Recognition Technology and Informative Evaluation Metrics

Over the last decade, machine learning based facial recognition (FR) systems have continued to increase in popularity while spreading to unique deployment settings. Despite the large variance among FR input distributions, popular facial recognition benchmarks continue to characterize system performance using one aggregate score over a single dataset. In many cases, the limitations of this score are unclear to downstream users: assuming benchmark accuracy is high, how is it expected to change for an image sampled from a distinct distribution? Which transformations can the model handle robustly, and which cause failure? Meanwhile, there is a large body of human facial perception research that aims to understand the underlying mechanisms of human recognition. This field offers methodological inspiration for more informative evaluation techniques, including the characterization of recognition performance as a function of a quantifiable input transformation. This work performs such an analysis. The performance scores of five state-of-the-art FR models are characterized as a function of Gaussian blur strength, intersecting with color variation. The performance-blur relationship is modeled as an s-curve, creating a highly interpretable format for discussion. Blur strength was consistently statistically significant to performance, but color variation did not significantly impact any model. Results are then compared to prior human recognition experiments. The best models outperform humans in low-blur regimes while humans outperform all models in high-blur regimes. These results motivate the need for modern benchmarks that capture a range of input distributions. The analysis presented can lead to a deeper understanding of FR systems, and provide a clearer interpretation of how model performance changes under quantified distribution shifts.

Name thesis:degree_name

Master

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2025

Author dc:creator

• Nakamura, Haley Marie

Advisor dc:contributor.advisor

• Sinha, Pawan

Statement dc:rights

• In Copyright - Educational Use Permitted
• Copyright retained by author(s)

Licence dc:rights.uri

• https://rightsstatements.org/page/InC-EDU/1.0/

Handle dc:identifier.uri

https://hdl.handle.net/1721.1/163037

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/163037