{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/158961"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/158961","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"System-Technology Co-Optimization of Scaled Electronics Based on Two-Dimensional Materials","abstract":"Over the past 60 years, the semiconductor industry has focused on developing highly scaled electronic devices and high-density integrated circuits. However, bottlenecks have arisen recently as transistor dimensions approach the physical limits, and integration density is constrained. This thesis addresses these issues with two-dimensional (2D) materials, which includes inventing a low-temperature (< 300 °C) metal-organic chemical vapor deposition (MOCVD) method for 2D materials on 8-inch wafers, investigating extreme device scaling and multi-channel transistors. Design-Technology Co-Optimization (DTCO) and SystemTechnology Co-Optimization (STCO) are employed to rapidly model, evaluate and optimize device and circuit performance. Moreover, heterogeneous integration and monolithic 3D integration techniques are investigated, addressing challenges in integrating 2D materials with silicon complementary-metal-oxide-semiconductor (CMOS) circuits and flexible substrates. This research aims to advance high-density, high-performance electronics with low-power consumption for next-generation integrated systems.","abstract_html":"Over the past 60 years, the semiconductor industry has focused on developing highly scaled electronic devices and high-density integrated circuits. However, bottlenecks have arisen recently as transistor dimensions approach the physical limits, and integration density is constrained. This thesis addresses these issues with two-dimensional (2D) materials, which includes inventing a low-temperature (&lt; 300 °C) metal-organic chemical vapor deposition (MOCVD) method for 2D materials on 8-inch wafers, investigating extreme device scaling and multi-channel transistors. Design-Technology Co-Optimization (DTCO) and SystemTechnology Co-Optimization (STCO) are employed to rapidly model, evaluate and optimize device and circuit performance. Moreover, heterogeneous integration and monolithic 3D integration techniques are investigated, addressing challenges in integrating 2D materials with silicon complementary-metal-oxide-semiconductor (CMOS) circuits and flexible substrates. This research aims to advance high-density, high-performance electronics with low-power consumption for next-generation integrated systems.","abstract_has_math":false,"creators":["Zhu, Jiadi"],"institution":"Massachusetts Institute of Technology","degree_name":"Doctoral","degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. 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This research aims to advance high-density, high-performance electronics with low-power consumption for next-generation integrated systems."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["Ph.D."]},{"key":"dc:title","label":"Title","values":["System-Technology Co-Optimization of Scaled Electronics Based on Two-Dimensional Materials"]}]}],"canonical_facts":{"dc:contributor.advisor":["Palacios, Tomás"],"dc:contributor.department":["Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science"],"dc:creator":["Zhu, Jiadi"],"dc:date.accessioned":["2025-03-27T17:00:47Z"],"dc:date.available":["2025-03-27T17:00:47Z"],"dc:date.issued":["2025-02"],"dc:description.abstract":["Over the past 60 years, the semiconductor industry has focused on developing highly scaled electronic devices and high-density integrated circuits. However, bottlenecks have arisen recently as transistor dimensions approach the physical limits, and integration density is constrained. This thesis addresses these issues with two-dimensional (2D) materials, which includes inventing a low-temperature (< 300 °C) metal-organic chemical vapor deposition (MOCVD) method for 2D materials on 8-inch wafers, investigating extreme device scaling and multi-channel transistors. Design-Technology Co-Optimization (DTCO) and SystemTechnology Co-Optimization (STCO) are employed to rapidly model, evaluate and optimize device and circuit performance. Moreover, heterogeneous integration and monolithic 3D integration techniques are investigated, addressing challenges in integrating 2D materials with silicon complementary-metal-oxide-semiconductor (CMOS) circuits and flexible substrates. 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