Next generation tools for smart electron microscopy

Smart Electron Microscopy (SmartEM) is a new generation EM imaging technology that promises to revolutionize microscopy. In this research, we explore the integration of advanced techniques to enhance this technology further. These include alternative characterization of high-resolution rescanning, cutting-edge vision models, incorporation of 3D information and vision transformers for improved neuronal segmentation and pipeline speedup. Our goal is to develop tools that improve the existing SmartEM pipeline, making it more versatile and effective for deployment in various practical settings.

Name thesis:degree_name

Master

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2024

Author dc:creator

• Sawmya, Shashata

Advisor dc:contributor.advisor

• Shavit, Nir N.

Statement dc:rights

• Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0)
• Copyright retained by author(s)

Licence dc:rights.uri

• https://creativecommons.org/licenses/by-nc-nd/4.0/

Handle dc:identifier.uri

https://hdl.handle.net/1721.1/156333

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/156333