Characterizing and using defects in high-temperature superconductor cables and magnets

High-temperature superconductor (HTS) cables and magnets are enabling a range of high-current and high-field applications, including compact fusion devices aiming to achieve net energy. Defects in HTS pose manufacturing, cost, and operational challenges. A rigorous understanding and predictive capability for defect-induced behavior at relevant scale has not been established. To address this shortcoming, a cable-level defect characterization experimental platform coupled to high-fidelity computational modeling is developed and the concept of using defects as a tool for controlling current distribution in HTS cables is explored. The cable (critical current = 438 A at 77.3 K, self-field) comprises a non-twisted 70 cm-long copper former containing a soldered stack of five rare-earth barium copper oxide (REBCO) tapes (each with a critical current of 115.7 A/4 mm-w at 77.3 K, self-field), which can contain a variety of induced defects. Spatially-resolved electric fields are measured with a high-density voltage tap array and absolute current distribution with six custom-wound embedded Rogowski coils. 3D circuit modeling uses nodal analysis and self-consistently accounts for the magnetic field dependence of critical current. Design, fabrication, calibration, and testing of the cable and instrumentation are described. Model validation results are presented, comparing cables with no defect, one defect, and two defects, and with tapes oriented in two different configurations. A cable containing a model-guided configuration of intentional defects is studied, demonstrating numerically and experimentally the use of defects for forcing more uniform current distributions in REBCO cables, one of many possible applications. The predictive capabilities developed in this work and the demonstration of the use of defects as a tool could enable the design of full-scale HTS cables and magnets that optimize defect tolerance and performance to improve cost, manufacturability, and robustness.

Name thesis:degree_name

Doctoral

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Nuclear Science and Engineering

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2024

Author dc:creator

• Ibekwe, Richard Tochi

Advisor dc:contributor.advisor

• Hartwig, Zachary S.

Statement dc:rights

• In Copyright - Educational Use Permitted
• Copyright retained by author(s)

Licence dc:rights.uri

• https://rightsstatements.org/page/InC-EDU/1.0/

Handle dc:identifier.uri

https://hdl.handle.net/1721.1/155616

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/155616