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Massachusetts Institute of Technology

Broken Expectations, Broken Concepts: A New Diagnosis of Dark Patterns

Abstract

dc:description.abstract

Interest in analyzing and preventing dark patterns, commonly defined as design that is manipulative or deceptive, has been rising. Most analyses of dark patterns today are descriptive, describing and categorizing examples of these patterns in user interfaces, making it difficult for stakeholders to identify the root causes of more structural and nuanced patterns. In this thesis, I propose a new definition: dark patterns emerge when a given design breaks users’ expectations and harms their interests. To formally define and analyze expectations, I use an existing design framework called concept design, which defines applications in terms of independent building blocks called concepts. I present a new type of design catalog built on concepts to empower organizations to set standards around expectations. I then introduce a formal definition of design extensions within concept design, bringing further precision to dark pattern analysis. This concept-based approach to analyzing dark patterns enables the identification of more subtle dark patterns at both a user interface level and a structural level, more precise analysis of the root cause of darkness within a design, and more nuanced consideration of the impact of cultural expectations on perceptions of darkness.

Degree

thesis:*
Name thesis:degree_name
Master
Department dc:contributor.department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2023

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Caragay, Evan
Advisor dc:contributor.advisor
  • Jackson, Daniel

Rights

dc:rights
Statement dc:rights
  • In Copyright - Educational Use Permitted
  • Copyright retained by author(s)

Identifiers

dc:identifier.*
Handle dc:identifier.uri
https://hdl.handle.net/1721.1/151383
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/151383

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Caragay, Evan. Broken Expectations, Broken Concepts: A New Diagnosis of Dark Patterns. Massachusetts Institute of Technology, 2023. https://hdl.handle.net/1721.1/151383