{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/145868"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/145868","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"Measurement of electron drift velocity in MOSFET inversion layers at high electric fields","abstract":"Thesis: M.S., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1986","abstract_html":"Thesis: M.S., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1986","abstract_has_math":false,"creators":["Bair, Lawrence A."],"institution":"Massachusetts Institute of Technology","degree_name":"Master","degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science","school":null,"contributors":[],"advisors":["Dimitri A. Antoniadis and Charles G. Sodini."],"committee_chairs":[],"committee_members":[],"year":1986,"date_issued":"1986","date_published":"1986","updated_at":"2026-07-22T22:22:30Z","subjects":["Electrical Engineering and Computer Science."],"languages":[],"rights":["MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided."],"rights_urls":["http://dspace.mit.edu/handle/1721.1/7582"],"identifier_entries":[]},"links":{"outbound_url":"https://hdl.handle.net/1721.1/145868","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Dimitri A. Antoniadis and Charles G. Sodini."]},{"key":"dc:contributor.department","label":"Department","values":["Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science"]},{"key":"dc:contributor.other","label":"Dc Contributor Other","values":["Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science."]},{"key":"dc:creator","label":"Author","values":["Bair, Lawrence A."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2022-10-17T20:00:55Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2022-10-17T20:00:55Z"]},{"key":"dc:date.issued","label":"Date","values":["1986"]},{"key":"dc:publisher","label":"Institution","values":["Massachusetts Institute of Technology"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Electrical Engineering and Computer Science."]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:rights","label":"Dc Rights","values":["MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided."]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://dspace.mit.edu/handle/1721.1/7582"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://hdl.handle.net/1721.1/145868"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Thesis: M.S., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1986","Bibliography: leaves 64-65."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["M.S."]},{"key":"dc:title","label":"Title","values":["Measurement of electron drift velocity in MOSFET inversion layers at high electric fields"]}]}],"canonical_facts":{"dc:contributor.advisor":["Dimitri A. Antoniadis and Charles G. Sodini."],"dc:contributor.department":["Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science"],"dc:contributor.other":["Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science."],"dc:creator":["Bair, Lawrence A."],"dc:date.accessioned":["2022-10-17T20:00:55Z"],"dc:date.available":["2022-10-17T20:00:55Z"],"dc:date.issued":["1986"],"dc:description":["Thesis: M.S., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1986","Bibliography: leaves 64-65."],"dc:description.degree":["M.S."],"dc:identifier.uri":["https://hdl.handle.net/1721.1/145868"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided."],"dc:rights.uri":["http://dspace.mit.edu/handle/1721.1/7582"],"dc:subject":["Electrical Engineering and Computer Science."],"dc:title":["Measurement of electron drift velocity in MOSFET inversion layers at high electric fields"],"dc:type":["Thesis"],"thesis:degree_name":["Master"]},"updated_at":"2026-07-22T22:22:30Z"}