{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/143261"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/143261","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"Large-Scale Characterization of Quantum Emitters in High-Purity Diamond","abstract":"Solid state quantum memories, such as color centers in diamond, are a leading platform for the distribution of quantum information. Quantum repeaters will require many qubit registers at every quantum network node, each with long-lived spin states and high-quality single photon emissions. Here, we present techniques for large-scale characterization of color centers in diamond. We first demonstrate automated confocal microscopy and apply it to characterize silicon vacancies in diamond overgrown via chemical vapor deposition and tin vacancies in overgrown and high pressure high temperature treated diamond, yielding narrow inhomogeneous distributions of both emitters. We then demonstrate widefield photoluminescence excitation microscopy as a tool to multiplex the characterization of color center optical properties, and apply it to measure the optical properties of silicon vacancies in a sample implanted with a focused ion beam. These techniques pave the way for future large-scale characterization efforts necessary to construct quantum memory nodes.","abstract_html":"Solid state quantum memories, such as color centers in diamond, are a leading platform for the distribution of quantum information. Quantum repeaters will require many qubit registers at every quantum network node, each with long-lived spin states and high-quality single photon emissions. Here, we present techniques for large-scale characterization of color centers in diamond. We first demonstrate automated confocal microscopy and apply it to characterize silicon vacancies in diamond overgrown via chemical vapor deposition and tin vacancies in overgrown and high pressure high temperature treated diamond, yielding narrow inhomogeneous distributions of both emitters. We then demonstrate widefield photoluminescence excitation microscopy as a tool to multiplex the characterization of color center optical properties, and apply it to measure the optical properties of silicon vacancies in a sample implanted with a focused ion beam. These techniques pave the way for future large-scale characterization efforts necessary to construct quantum memory nodes.","abstract_has_math":false,"creators":["Sutula, Madison M."],"institution":"Massachusetts Institute of Technology","degree_name":"Master","degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science","school":null,"contributors":[],"advisors":["Englund, Dirk R."],"committee_chairs":[],"committee_members":[],"year":2022,"date_issued":"2022-02","date_published":"2022-02","updated_at":"2026-07-22T22:21:44Z","subjects":[],"languages":[],"rights":["In Copyright - Educational Use Permitted","Copyright MIT"],"rights_urls":["http://rightsstatements.org/page/InC-EDU/1.0/"],"identifier_entries":[]},"links":{"outbound_url":"https://hdl.handle.net/1721.1/143261","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Englund, Dirk R."]},{"key":"dc:contributor.department","label":"Department","values":["Massachusetts Institute of Technology. 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Quantum repeaters will require many qubit registers at every quantum network node, each with long-lived spin states and high-quality single photon emissions. Here, we present techniques for large-scale characterization of color centers in diamond. We first demonstrate automated confocal microscopy and apply it to characterize silicon vacancies in diamond overgrown via chemical vapor deposition and tin vacancies in overgrown and high pressure high temperature treated diamond, yielding narrow inhomogeneous distributions of both emitters. We then demonstrate widefield photoluminescence excitation microscopy as a tool to multiplex the characterization of color center optical properties, and apply it to measure the optical properties of silicon vacancies in a sample implanted with a focused ion beam. These techniques pave the way for future large-scale characterization efforts necessary to construct quantum memory nodes."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["S.M."]},{"key":"dc:title","label":"Title","values":["Large-Scale Characterization of Quantum Emitters in High-Purity Diamond"]}]}],"canonical_facts":{"dc:contributor.advisor":["Englund, Dirk R."],"dc:contributor.department":["Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science"],"dc:creator":["Sutula, Madison M."],"dc:date.accessioned":["2022-06-15T13:07:59Z"],"dc:date.available":["2022-06-15T13:07:59Z"],"dc:date.issued":["2022-02"],"dc:description.abstract":["Solid state quantum memories, such as color centers in diamond, are a leading platform for the distribution of quantum information. Quantum repeaters will require many qubit registers at every quantum network node, each with long-lived spin states and high-quality single photon emissions. Here, we present techniques for large-scale characterization of color centers in diamond. We first demonstrate automated confocal microscopy and apply it to characterize silicon vacancies in diamond overgrown via chemical vapor deposition and tin vacancies in overgrown and high pressure high temperature treated diamond, yielding narrow inhomogeneous distributions of both emitters. We then demonstrate widefield photoluminescence excitation microscopy as a tool to multiplex the characterization of color center optical properties, and apply it to measure the optical properties of silicon vacancies in a sample implanted with a focused ion beam. These techniques pave the way for future large-scale characterization efforts necessary to construct quantum memory nodes."],"dc:description.degree":["S.M."],"dc:identifier.uri":["https://hdl.handle.net/1721.1/143261"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["In Copyright - Educational Use Permitted","Copyright MIT"],"dc:rights.uri":["http://rightsstatements.org/page/InC-EDU/1.0/"],"dc:title":["Large-Scale Characterization of Quantum Emitters in High-Purity Diamond"],"dc:type":["Thesis"],"thesis:degree_name":["Master","Master of Science in Electrical Engineering and Computer Science"]},"updated_at":"2026-07-22T22:21:44Z"}