Accurate characterization of nanophotonic grating structures

Augmented reality waveguides are designed to have grating regions to in-couple, out-couple, and propagate light from a light engine to the user. This thesis develops two reliable systems to qualify manufactured waveguides. The first system determines grating quality by measuring grating pitch and orientation uniformity across grating regions. The system uses scatterometry in Littrow configuration and captures both the reflected zeroth and first order diffracted light. The second system determines the overall quality of a waveguide by measuring the resolution of the device using a Modulation Transfer Function, MTF, technique. MTF is commonly measured using either the line pair method or the slant edge method. This thesis proposes a new method to measure MTF using single pixel illumination and point spread function. Results from the two systems are presented, and the capabilities and limitations of each system are explored.

Name thesis:degree_name

Master

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2020

Author dc:creator

• Yeung, Wings T.

Advisor dc:contributor.advisor

• Cardinal Warde and Jinxin Fu.

• Electrical Engineering and Computer Science.

Statement dc:rights

• MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

https://hdl.handle.net/1721.1/129848

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/129848