Design of a linear cavity and a characterization setup for multi-pass transmission electron microscopy

In this thesis, the different electron optical components necessary to build a linear cavity for multi-pass transmission electron microscopy are analyzed and simulated. Moreover, a prototype of the core component, the gated mirror, was designed and some preliminary experimental testings were carried out to asses its optical properties. Then, an architecture of the complete linear cavity, including the correction of spherical aberration and image rotation was designed, optimized and validated through simulation. Finally, an experimental setup for the characterization of electron optical elements was also designed, implemented and experimentally tested. Such a diagnostics setup is going to be adopted for the verification of the multi-pass components optical properties, performance, and their agreement to the design specifications.

Name thesis:degree_name

Master

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2019

Author dc:creator

• Turchetti, Marco.

Advisor dc:contributor.advisor

• Karl K. Berggren.

• Electrical Engineering and Computer Science.

Statement dc:rights

• MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

https://hdl.handle.net/1721.1/121744

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/121744