Massachusetts Institute of Technology
Development and testing of an in situ method of ion beam analysis for measuring high-Z erosion inside a tokamak using an AIMS diagnostic
Abstract
dc:description.abstractWhile many ex situ measurements exist to measure plasma-facing component (PFC) surfaces of materials extracted from tokamaks, developing a deeper understanding of the dynamics of erosion, redeposition, and fuel retention in these surfaces will require in situ measurements. A first-of-a-kind technique, Accelerator-Based In-Situ Materials Surveillance (AIMS), was developed for this purpose and first demonstrated on Alcator C-Mod to study divertor surfaces with shot-by-shot resolution [1]. However, the original AIMS methods are not applicable to studying the erosion of bulk, high-Z PFCs like molybdenum and tungsten. Thus, a new method of ion beam analysis (IBA) has been developed to expand the capabilities of AIMS to directly measure this high-Z bulk erosion. This new method, called DEA (Depth markers for Evaluating high-Z materials with AIMS), combines the traditional IBA technique of particle-induced gamma emission (PIGE) with implanted depth markers.
Degree
thesis:*- Name thesis:degree_name
- Doctoral
- Department dc:contributor.department
- Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 2019
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Kesler, Leigh A.(Leigh Ann)
- Advisor dc:contributor.advisor
-
- Dennis G. Whyte and Zachary S. Hartwig.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.
- Licence dc:rights.uri
- Language dc:language.iso
- eng
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- https://hdl.handle.net/1721.1/121707
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/121707