A pipelined analog-to-digital converter with low-gain, low-bandwidth op-amps

Designing a high-gain, high-bandwidth op-amp for pipelined ADCs in fine-line CMOS technology has become increasingly challenging. In order to address this issue, this thesis presents the shadow-ADC-assisted digital calibration technique. The proposed technique relaxes op-amp performance requirements by removing op-amp-induced charge-transfer errors in the digital domain. A proof-of-concept pipelined ADC has been designed in 28nm FDSOI CMOS technology and is currently being fabricated.

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2017

Author dc:creator

• Jeong, Taehoon

Advisor dc:contributor.advisor

• Anantha P. Chandrakasan and Hae-Seung Lee.

• Electrical Engineering and Computer Science.

Statement dc:rights

• MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/111917

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/111917