{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/105997"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/105997","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"Design of on-chip monitoring circuits for clock delay and temperature","abstract":"As devices continue to scale, Process, Voltage and Temperature (PVT) variations tend to have a bigger impact on circuit performance. The ability to measure this impact provides essential knowledge about the circuit's current performance and opens the door to compensation techniques. Off-chip measurement circuits are usually of limited bandwidth and load the measured circuit, thus affecting the measurement result. Onchip circuits on the other hand have the potential for high bandwidth and, if designed well, have small area and can be incorporated into different parts of the chip. For this project a delay and temperature measurement circuit is designed. The delay measurement circuit relies on a method called Code Density Test (CDT), a statistical method which involves counting the number of asynchronous edges that occur within the relative delay of two synchronous clocks. The temperature measurement circuit converts temperature to a delay which can then be measured by the CDT circuit.","abstract_html":"As devices continue to scale, Process, Voltage and Temperature (PVT) variations tend to have a bigger impact on circuit performance. The ability to measure this impact provides essential knowledge about the circuit's current performance and opens the door to compensation techniques. Off-chip measurement circuits are usually of limited bandwidth and load the measured circuit, thus affecting the measurement result. Onchip circuits on the other hand have the potential for high bandwidth and, if designed well, have small area and can be incorporated into different parts of the chip. For this project a delay and temperature measurement circuit is designed. The delay measurement circuit relies on a method called Code Density Test (CDT), a statistical method which involves counting the number of asynchronous edges that occur within the relative delay of two synchronous clocks. The temperature measurement circuit converts temperature to a delay which can then be measured by the CDT circuit.","abstract_has_math":false,"creators":["Kakuru, George Bamuturaki"],"institution":"Massachusetts Institute of Technology","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.","school":null,"contributors":[],"advisors":["Charles G. Sodini, Jeremy Walker, and Andrew Lewine."],"committee_chairs":[],"committee_members":[],"year":2016,"date_issued":"2016","date_published":"2016","updated_at":"2026-07-22T22:21:47Z","subjects":["Electrical Engineering and Computer Science."],"languages":["eng"],"rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"rights_urls":["http://dspace.mit.edu/handle/1721.1/7582"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/1721.1/105997","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Charles G. 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They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://dspace.mit.edu/handle/1721.1/7582"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/1721.1/105997"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.","This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.","Cataloged from student-submitted PDF version of thesis.","Includes bibliographical references (pages 81-82)."]},{"key":"dc:description.abstract","label":"Abstract","values":["As devices continue to scale, Process, Voltage and Temperature (PVT) variations tend to have a bigger impact on circuit performance. The ability to measure this impact provides essential knowledge about the circuit's current performance and opens the door to compensation techniques. Off-chip measurement circuits are usually of limited bandwidth and load the measured circuit, thus affecting the measurement result. Onchip circuits on the other hand have the potential for high bandwidth and, if designed well, have small area and can be incorporated into different parts of the chip. For this project a delay and temperature measurement circuit is designed. The delay measurement circuit relies on a method called Code Density Test (CDT), a statistical method which involves counting the number of asynchronous edges that occur within the relative delay of two synchronous clocks. The temperature measurement circuit converts temperature to a delay which can then be measured by the CDT circuit."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["M. Eng."]},{"key":"dc:title","label":"Title","values":["Design of on-chip monitoring circuits for clock delay and temperature"]}]}],"canonical_facts":{"dc:contributor.advisor":["Charles G. Sodini, Jeremy Walker, and Andrew Lewine."],"dc:contributor.department":["Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science."],"dc:contributor.other":["Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science."],"dc:creator":["Kakuru, George Bamuturaki"],"dc:date.accessioned":["2016-12-22T15:17:57Z"],"dc:date.available":["2016-12-22T15:17:57Z"],"dc:date.issued":["2016"],"dc:description":["Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.","This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.","Cataloged from student-submitted PDF version of thesis.","Includes bibliographical references (pages 81-82)."],"dc:description.abstract":["As devices continue to scale, Process, Voltage and Temperature (PVT) variations tend to have a bigger impact on circuit performance. The ability to measure this impact provides essential knowledge about the circuit's current performance and opens the door to compensation techniques. Off-chip measurement circuits are usually of limited bandwidth and load the measured circuit, thus affecting the measurement result. Onchip circuits on the other hand have the potential for high bandwidth and, if designed well, have small area and can be incorporated into different parts of the chip. For this project a delay and temperature measurement circuit is designed. The delay measurement circuit relies on a method called Code Density Test (CDT), a statistical method which involves counting the number of asynchronous edges that occur within the relative delay of two synchronous clocks. The temperature measurement circuit converts temperature to a delay which can then be measured by the CDT circuit."],"dc:description.degree":["M. Eng."],"dc:identifier.uri":["http://hdl.handle.net/1721.1/105997"],"dc:language.iso":["eng"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"dc:rights.uri":["http://dspace.mit.edu/handle/1721.1/7582"],"dc:subject":["Electrical Engineering and Computer Science."],"dc:title":["Design of on-chip monitoring circuits for clock delay and temperature"],"dc:type":["Thesis"]},"updated_at":"2026-07-22T22:21:47Z"}