{"id":{"repo_id":"missouri","oai_identifier":"oai:mospace.umsystem.edu:10355/4521"},"canonical_url":"https://search.dev.ndltd.org/etd/missouri/oai:mospace.umsystem.edu:10355/4521","repository":{"repo_id":"missouri","name":"University of Missouri","base_url":"https://mospace.umsystem.edu/oai/request"},"display":{"title":"On the simulations of correlated nakagami-m fading channels using sum-of-sinusoids method","abstract":"This research work discusses the generation of Nakagami-m fading samples from sum-of-sinusoids method in which Nakagami process is generated by taking square root of Gamma process. Gamma process itself can be realized using Gaussian processes. We have used Improved Jake's Model to characterize the low-pass Gaussian Processes. We also studied second order statistics e.g. ensemble autocorrelation of this simulator and essential properties like Level Crossing Rate and Average Fade Duration. It has been found that simulation and theoretical results have very good fit. Furthermore, we extended this methodology to n-branch vector Nakagami-m fading channel for diversity reception. We have found excellent agreement of the simulation results to its theoretical counterparts.","abstract_html":"This research work discusses the generation of Nakagami-m fading samples from sum-of-sinusoids method in which Nakagami process is generated by taking square root of Gamma process. Gamma process itself can be realized using Gaussian processes. We have used Improved Jake's Model to characterize the low-pass Gaussian Processes. We also studied second order statistics e.g. ensemble autocorrelation of this simulator and essential properties like Level Crossing Rate and Average Fade Duration. It has been found that simulation and theoretical results have very good fit. Furthermore, we extended this methodology to n-branch vector Nakagami-m fading channel for diversity reception. We have found excellent agreement of the simulation results to its theoretical counterparts.","abstract_has_math":false,"creators":["Patil, Dhiraj Dilip"],"institution":"University of Missouri--Columbia","degree_name":"M.S.","degree_level":"Masters","degree_discipline":"Electrical and computer engineering (MU)","degree_department":null,"school":null,"contributors":[],"advisors":["Xiao, Chengshan"],"committee_chairs":[],"committee_members":[],"year":2006,"date_issued":"2006","date_published":"2006","updated_at":"2026-07-24T03:07:57Z","subjects":[],"languages":["eng","English"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier.doi","label":"DOI","values":["https://doi.org/10.32469/10355/4521"],"render_values":[{"text":"https://doi.org/10.32469/10355/4521","href":"https://doi.org/10.32469/10355/4521","code":true}]}]},"links":{"outbound_url":"https://hdl.handle.net/10355/4521","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Xiao, Chengshan"]},{"key":"dc:creator","label":"Author","values":["Patil, Dhiraj Dilip"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2010-01-12T17:47:19Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2010-01-12T17:47:19Z"]},{"key":"dc:date.issued","label":"Date","values":["2006"]},{"key":"dc:publisher","label":"Institution","values":["University of Missouri--Columbia"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical and computer engineering (MU)"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Missouri--Columbia"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["English"]},{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.doi","label":"DOI","values":["https://doi.org/10.32469/10355/4521"]},{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://hdl.handle.net/10355/4521"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["The entire dissertation/thesis text is included in the research.pdf file; the official abstract appears in the short.pdf file (which also appears in the research.pdf); a non-technical general description, or public abstract, appears in the public.pdf file.","Title from title screen of research.pdf file (viewed on August 27, 2007)","Includes bibliographical references.","Thesis (M.S.) University of Missouri-Columbia 2006.","Dissertations, Academic -- University of Missouri--Columbia -- Electrical engineering."]},{"key":"dc:description.abstract","label":"Abstract","values":["This research work discusses the generation of Nakagami-m fading samples from sum-of-sinusoids method in which Nakagami process is generated by taking square root of Gamma process. Gamma process itself can be realized using Gaussian processes. We have used Improved Jake's Model to characterize the low-pass Gaussian Processes. We also studied second order statistics e.g. ensemble autocorrelation of this simulator and essential properties like Level Crossing Rate and Average Fade Duration. It has been found that simulation and theoretical results have very good fit. Furthermore, we extended this methodology to n-branch vector Nakagami-m fading channel for diversity reception. We have found excellent agreement of the simulation results to its theoretical counterparts."]},{"key":"dc:title","label":"Title","values":["On the simulations of correlated nakagami-m fading channels using sum-of-sinusoids method"]}]}],"canonical_facts":{"dc:contributor.advisor":["Xiao, Chengshan"],"dc:creator":["Patil, Dhiraj Dilip"],"dc:date.accessioned":["2010-01-12T17:47:19Z"],"dc:date.available":["2010-01-12T17:47:19Z"],"dc:date.issued":["2006"],"dc:description":["The entire dissertation/thesis text is included in the research.pdf file; the official abstract appears in the short.pdf file (which also appears in the research.pdf); a non-technical general description, or public abstract, appears in the public.pdf file.","Title from title screen of research.pdf file (viewed on August 27, 2007)","Includes bibliographical references.","Thesis (M.S.) University of Missouri-Columbia 2006.","Dissertations, Academic -- University of Missouri--Columbia -- Electrical engineering."],"dc:description.abstract":["This research work discusses the generation of Nakagami-m fading samples from sum-of-sinusoids method in which Nakagami process is generated by taking square root of Gamma process. Gamma process itself can be realized using Gaussian processes. We have used Improved Jake's Model to characterize the low-pass Gaussian Processes. We also studied second order statistics e.g. ensemble autocorrelation of this simulator and essential properties like Level Crossing Rate and Average Fade Duration. It has been found that simulation and theoretical results have very good fit. Furthermore, we extended this methodology to n-branch vector Nakagami-m fading channel for diversity reception. We have found excellent agreement of the simulation results to its theoretical counterparts."],"dc:identifier.doi":["https://doi.org/10.32469/10355/4521"],"dc:identifier.uri":["https://hdl.handle.net/10355/4521"],"dc:language":["English"],"dc:language.iso":["eng"],"dc:publisher":["University of Missouri--Columbia"],"dc:title":["On the simulations of correlated nakagami-m fading channels using sum-of-sinusoids method"],"dc:type":["Thesis"],"thesis:degree_discipline":["Electrical and computer engineering (MU)"],"thesis:degree_level":["Masters"],"thesis:degree_name":["M.S."],"thesis:institution_name":["University of Missouri--Columbia"]},"updated_at":"2026-07-24T03:07:57Z"}