Back to results

京都大学 (Kyoto University)

Lattice location of impurities in ZnSe and GaN as studied by ion beam analysis

Degree

thesis:*
Grantor dc:publisher
京都大学 (Kyoto University)
Year dc:date.issued
2000

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Kobayashi, Hajime
Advisors dc:contributor.advisor
  • 今井, 憲一
  • 野田, 章
  • 笹尾, 登

Rights

Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/2433/181171
OAI identifier oai:identifier
oai:repository.kulib.kyoto-u.ac.jp:2433/181171

Chain of custody

source
Harvested from
Kyoto University
Base URL
repository.kulib.kyoto-u.ac.jp/server/oai/request
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
related terms
citation

Kobayashi, Hajime. Lattice location of impurities in ZnSe and GaN as studied by ion beam analysis. 京都大学 (Kyoto University), 2000. http://hdl.handle.net/2433/181171