High Extinction Ratio Subwavelength 1D Infrared Polarizer by Nanoimprint Lithography
type: CreativeWork
description: Infrared (IR) polarizers have been widely used in military and commercial applications. Controlling the polarization of incident light is one of major issues in the detector systems. However, conventional polarimetric IR detectors require series of polarizers and optical components, which increase the volume and weight of the system. In this research, stacked 1-dimensional (1-D) subwavelength grating structures were studied to develop compact size IR polarimetric detector by using surface plasmonic polariton. Experimental parameters were optimized by Finite Diﬀerence Time Domain (FDTD) simulation. Eﬀects of gold (Au) grating size, numbers of stacked gratings, and dielectric space height were tested in the FDTD study. The fabrication of grating layers was conducted by using nanoimprint lithography. The samples were characterized by scanning electron microscopy. IR transmissions in transverse magnetic (TM) and transverse electric (TE) modes were measured by Fourier transform infrared spectroscopy (FTIR).
abstract: Infrared (IR) polarizers have been widely used in military and commercial applications. Controlling the polarization of incident light is one of major issues in the detector systems. However, conventional polarimetric IR detectors require series of polarizers and optical components, which increase the volume and weight of the system. In this research, stacked 1-dimensional (1-D) subwavelength grating structures were studied to develop compact size IR polarimetric detector by using surface plasmonic polariton. Experimental parameters were optimized by Finite Diﬀerence Time Domain (FDTD) simulation. Eﬀects of gold (Au) grating size, numbers of stacked gratings, and dielectric space height were tested in the FDTD study. The fabrication of grating layers was conducted by using nanoimprint lithography. The samples were characterized by scanning electron microscopy. IR transmissions in transverse magnetic (TM) and transverse electric (TE) modes were measured by Fourier transform infrared spectroscopy (FTIR).
author: Kim, Jeonghwan
language: en_US
keywords: Subwavelength, Polarizer, Infrared, Nanoimprint Lithography
date published: 2016
date modified: 2026-07-24T02:40:35Z
provider: IUPUI
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: IUPUI

PropertyValue
property ID: Handle
value: https://hdl.handle.net/1805/10920

PropertyValue
property ID: DOI
value: 10.7912/C2/2628

PropertyValue
property ID: DOI
value: 10.7912/C2F888