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Ghent University. Faculty of Engineering and Architecture
Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits
Degree
thesis:*- Grantor dc:publisher
- Ghent University. Faculty of Engineering and Architecture
- Year dc:date
- 2018
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Lambrecht, Niels
- Contributors dc:contributor
-
- Vande Ginste, Dries
- De Zutter, Daniël
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- info:eu-repo/semantics/openAccess
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
https://biblio.ugent.be/publication/8561036
urn:isbn:9789463551106
https://biblio.ugent.be/publication/8561036/file/8561037 - OAI identifier oai:identifier
- oai:archive.ugent.be:8561036