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Georgia Institute of Technology
Some applications of the Bechhofer-Kiefer-Sobel generalized sequential probability ratio test to software reliability testing
Abstract
Ph.D.
Degree
thesis:*- Department dc:contributor.department
- Sciences
- Grantor dc:publisher
- Georgia Institute of Technology
- Year dc:date.issued
- 1992
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Shieh, Jung-Sheng
- Advisor dc:contributor.advisor
-
- Tong, Yung L.
Identifiers
dc:identifier.*- Dc Identifier Other
- 359020
- OAI identifier oai:identifier
- oai:repository.gatech.edu:1853/28928