{"id":{"repo_id":"freiburg-diss","oai_identifier":"oai:freidok.uni-freiburg.de:613"},"canonical_url":"https://search.dev.ndltd.org/etd/freiburg-diss/oai:freidok.uni-freiburg.de:613","repository":{"repo_id":"freiburg-diss","name":"University of Freiburg","base_url":"https://freidok.uni-freiburg.de/oai/oai2.php"},"display":{"title":"Basics of detached Bridgman growth of Ge1-xSix crystals","abstract":"Detached growth (or dewetting) refers to the fact that a small gap develops between growing crystal and container wall. Thus, the crystal grows wall-free, a small melt meniscus is formed between the growth interface and the ampoule. The contact-free growth reduces mechanical stress in the growing crystal resulting in a better crystal quality with less defect density. <br>High contact angles and high growth angles favor crystal detachment. Therefore, the knowledge of the contact angle is essential for choosing an appropriate ampoule material. Contact angles of Ge and Ge1-xSix (with Si concentrations up to 14 at-) were measured for a variety of potential crucible materials using the sessile drop technique. The surface tension of Ge and Ge1-xSix, as well as its temperature and concentration dependence, was determined simultaneously. <br>Growth experiments were performed in pBN (pyrolytic boron nitrite) and fused silica ampoules. The detached crystals were characterized with respect to their crystal quality (defect density) and impurity concentration.","abstract_html":"Detached growth (or dewetting) refers to the fact that a small gap develops between growing crystal and container wall. Thus, the crystal grows wall-free, a small melt meniscus is formed between the growth interface and the ampoule. The contact-free growth reduces mechanical stress in the growing crystal resulting in a better crystal quality with less defect density. &lt;br&gt;High contact angles and high growth angles favor crystal detachment. Therefore, the knowledge of the contact angle is essential for choosing an appropriate ampoule material. Contact angles of Ge and Ge1-xSix (with Si concentrations up to 14 at-) were measured for a variety of potential crucible materials using the sessile drop technique. The surface tension of Ge and Ge1-xSix, as well as its temperature and concentration dependence, was determined simultaneously. &lt;br&gt;Growth experiments were performed in pBN (pyrolytic boron nitrite) and fused silica ampoules. The detached crystals were characterized with respect to their crystal quality (defect density) and impurity concentration.","abstract_has_math":false,"creators":["Salk, Natalie"],"institution":null,"degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":["Benz, Klaus-Werner"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":null,"date_issued":"","date_published":null,"updated_at":"2026-07-24T02:21:46Z","subjects":["Germanium-Silizium","wandfreies Wachstum","Sessile Drop-Methode","detached Bridgman","contact angle","surface tension","growth angle"],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://freidok.uni-freiburg.de/data/613","outbound_label":"Repository record","outbound_source":"source_url"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Benz, Klaus-Werner"]},{"key":"dc:creator","label":"Author","values":["Salk, Natalie"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:type","label":"Dc Type","values":["DoctoralThesis"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Germanium-Silizium","wandfreies Wachstum","Sessile Drop-Methode","detached Bridgman","contact angle","surface tension","growth angle"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["Detached growth (or dewetting) refers to the fact that a small gap develops between growing crystal and container wall. Thus, the crystal grows wall-free, a small melt meniscus is formed between the growth interface and the ampoule. The contact-free growth reduces mechanical stress in the growing crystal resulting in a better crystal quality with less defect density. <br>High contact angles and high growth angles favor crystal detachment. Therefore, the knowledge of the contact angle is essential for choosing an appropriate ampoule material. Contact angles of Ge and Ge1-xSix (with Si concentrations up to 14 at-) were measured for a variety of potential crucible materials using the sessile drop technique. The surface tension of Ge and Ge1-xSix, as well as its temperature and concentration dependence, was determined simultaneously. <br>Growth experiments were performed in pBN (pyrolytic boron nitrite) and fused silica ampoules. The detached crystals were characterized with respect to their crystal quality (defect density) and impurity concentration."]},{"key":"dc:format.medium","label":"Dc Format Medium","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Basics of detached Bridgman growth of Ge1-xSix crystals","Grundlagen des wandfreien Wachstums von Ge1-xSix Kristallen nach der Bridgman Methode"]}]}],"canonical_facts":{"dc:contributor":["Benz, Klaus-Werner"],"dc:creator":["Salk, Natalie"],"dc:description.abstract":["Detached growth (or dewetting) refers to the fact that a small gap develops between growing crystal and container wall. Thus, the crystal grows wall-free, a small melt meniscus is formed between the growth interface and the ampoule. The contact-free growth reduces mechanical stress in the growing crystal resulting in a better crystal quality with less defect density. <br>High contact angles and high growth angles favor crystal detachment. Therefore, the knowledge of the contact angle is essential for choosing an appropriate ampoule material. Contact angles of Ge and Ge1-xSix (with Si concentrations up to 14 at-) were measured for a variety of potential crucible materials using the sessile drop technique. The surface tension of Ge and Ge1-xSix, as well as its temperature and concentration dependence, was determined simultaneously. <br>Growth experiments were performed in pBN (pyrolytic boron nitrite) and fused silica ampoules. The detached crystals were characterized with respect to their crystal quality (defect density) and impurity concentration."],"dc:format.medium":["application/pdf"],"dc:subject":["Germanium-Silizium","wandfreies Wachstum","Sessile Drop-Methode","detached Bridgman","contact angle","surface tension","growth angle"],"dc:title":["Basics of detached Bridgman growth of Ge1-xSix crystals","Grundlagen des wandfreien Wachstums von Ge1-xSix Kristallen nach der Bridgman Methode"],"dc:type":["DoctoralThesis"]},"updated_at":"2026-07-24T02:21:46Z"}