Integration of GaAs on Si Nanostructures: Investigation of Growth, Defects, and Interfaces
type: CreativeWork
author: Kozak, Roksolana
language: en
keywords: Semiconductor nanocrystals; GaAs/Si Integration; Electron Microscopy, info:eu-repo/classification/ddc/530, info:eu-repo/classification/ddc/620, Physics, Engineering & allied operations
license: http://rightsstatements.org/page/InC-NC/1.0/
date published: 2018-07
date modified: 2026-07-27T19:27:27Z
provider: ETH Zürich
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: ETH Zurich

PropertyValue
property ID: Handle
value: http://hdl.handle.net/20.500.11850/303208

PropertyValue
property ID: DOI
value: 10.3929/ethz-b-000303208