Testing ICs derived from abstract circuits

Goorden, Jac

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Technische Universiteit Eindhoven

Testing ICs derived from abstract circuits

dc:creator Goorden, Jac

dc:type.qualificationname Master

dc:date.issued1988

Degree

thesis:*

Name dc:type.qualificationname: Master
Level dc:type.qualificationlevel: Studentthesis types
Year dc:date.issued: 1988

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Goorden, Jac
Advisors dc:contributor.advisor: Rem, Martin
van Berkel, Kees
Beenker, F.

Rights

Language dc:language: eng

Identifiers

dc:identifier.*

Identifier: oai:pure.tue.nl:studenttheses/fcdb1240-eca2-4155-8c59-f7ceddcd7c2e
OAI identifier oai:identifier: oai:pure.tue.nl:studenttheses/fcdb1240-eca2-4155-8c59-f7ceddcd7c2e

Chain of custody

source

Harvested from: Technische Universiteit Eindhoven
Base URL: pure.tue.nl/ws/oai
Last updated: 2026-07-24
Source record: OAI-PMH GetRecord

related terms

citation

Goorden, Jac. Testing ICs derived from abstract circuits. Studentthesis types thesis, 1988. https://research.tue.nl/nl/studentTheses/fcdb1240-eca2-4155-8c59-f7ceddcd7c2e

Testing ICs derived from abstract circuits

Degree

Author and committee

Rights

Identifiers

Chain of custody

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