{"id":{"repo_id":"eindhoven","oai_identifier":"oai:pure.tue.nl:studenttheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c"},"canonical_url":"https://search.dev.ndltd.org/etd/eindhoven/oai:pure.tue.nl:studenttheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c","repository":{"repo_id":"eindhoven","name":"Technische Universiteit Eindhoven","base_url":"https://pure.tue.nl/ws/oai"},"display":{"title":"Digit-error-rate and complexity : analysis of a new coding algorithm for the defect channel and the erasure channel","abstract":"","abstract_html":null,"abstract_has_math":false,"creators":["Peek, J.A."],"institution":null,"degree_name":"Master","degree_level":"Studentthesis types","degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":["Schalkwijk, J.P.M."],"committee_chairs":[],"committee_members":[],"year":1988,"date_issued":"1988-3-31","date_published":"1988-3-31","updated_at":"2026-07-24T02:14:44Z","subjects":[],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["oai:pure.tue.nl:studenttheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c"],"render_values":[{"text":"oai:pure.tue.nl:studenttheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c","href":null,"code":true}]}]},"links":{"outbound_url":"https://research.tue.nl/nl/studentTheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Schalkwijk, J.P.M."]},{"key":"dc:creator","label":"Author","values":["Peek, J.A."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["1988-3-31"]},{"key":"dc:date.issued","label":"Date","values":["1988-3-31"]},{"key":"dc:publisher.department","label":"Dc Publisher Department","values":["Electrical Engineering"]},{"key":"dc:relation.isreferencedby","label":"Dc Relation Isreferencedby","values":["https://research.tue.nl/nl/studentTheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.qualificationlevel","label":"Dc Type Qualificationlevel","values":["Studentthesis types"]},{"key":"dc:type.qualificationname","label":"Dc Type Qualificationname","values":["Master"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["oai:pure.tue.nl:studenttheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c","https://research.tue.nl/nl/studentTheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c"]},{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://research.tue.nl/files/46717569/286978-1.pdf"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:title","label":"Title","values":["Digit-error-rate and complexity : analysis of a new coding algorithm for the defect channel and the erasure channel"]}]}],"canonical_facts":{"dc:contributor.advisor":["Schalkwijk, J.P.M."],"dc:creator":["Peek, J.A."],"dc:date":["1988-3-31"],"dc:date.issued":["1988-3-31"],"dc:identifier":["oai:pure.tue.nl:studenttheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c","https://research.tue.nl/nl/studentTheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c"],"dc:identifier.uri":["https://research.tue.nl/files/46717569/286978-1.pdf"],"dc:language":["eng"],"dc:publisher.department":["Electrical Engineering"],"dc:relation.isreferencedby":["https://research.tue.nl/nl/studentTheses/1fa445e7-9dab-4415-bbc8-6dbb22ca938c"],"dc:title":["Digit-error-rate and complexity : analysis of a new coding algorithm for the defect channel and the erasure channel"],"dc:type":["Thesis"],"dc:type.qualificationlevel":["Studentthesis types"],"dc:type.qualificationname":["Master"]},"updated_at":"2026-07-24T02:14:44Z"}