{"id":{"repo_id":"cent-lancashire","oai_identifier":"oai:clok.uclan.ac.uk:20361"},"canonical_url":"https://search.dev.ndltd.org/etd/cent-lancashire/oai:clok.uclan.ac.uk:20361","repository":{"repo_id":"cent-lancashire","name":"University of Central Lancashire","base_url":"https://clok.uclan.ac.uk/cgi/oai2"},"display":{"title":"Analysis and simulation of neutron diffraction patterns","abstract":"The analysis of neutron diffraction powder patterns and the simulation of single crystal oscillation patterns is described. The main factors governing the position and intensity of the coherent diffraction peaks and the factors contributing to the background level of scattered radiation in the diffraction pattern are discussed. Computer programs are described which have been used to reduce the raw data producedby a multicounter powder diffractometer, such as the DIDO Curran instrwnent at AEBE, Harwell, into a single normalised count against angle; to detect peaks in the normalised data, to calculate their intensity and to separate the peaks from the background so that further analysis can be performed separately on the peaks and background of the pattern. The locations of diffraction spots produced on a single crystal oscillation X ray or neutron di!ffraction photograph are calculated and the pattern is simulated to asSist the interpretation of magnetic and chemical structures. Comparison is made with data obtained from the D12 neutron oscillation camera facility at the Institut Max Von Laue, Paul Langevin, Grenoble.","abstract_html":"The analysis of neutron diffraction powder patterns and the simulation of single crystal oscillation patterns is described. The main factors governing the position and intensity of the coherent diffraction peaks and the factors contributing to the background level of scattered radiation in the diffraction pattern are discussed. Computer programs are described which have been used to reduce the raw data producedby a multicounter powder diffractometer, such as the DIDO Curran instrwnent at AEBE, Harwell, into a single normalised count against angle; to detect peaks in the normalised data, to calculate their intensity and to separate the peaks from the background so that further analysis can be performed separately on the peaks and background of the pattern. The locations of diffraction spots produced on a single crystal oscillation X ray or neutron di!ffraction photograph are calculated and the pattern is simulated to asSist the interpretation of magnetic and chemical structures. Comparison is made with data obtained from the D12 neutron oscillation camera facility at the Institut Max Von Laue, Paul Langevin, Grenoble.","abstract_has_math":false,"creators":["Peak, Michael Samuel"],"institution":"University of Salford","degree_name":"msc","degree_level":"masters","degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1981,"date_issued":"1981","date_published":"1981","updated_at":"2026-07-24T01:36:10Z","subjects":["F310 - Applied physics"],"languages":["en"],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":null,"outbound_label":null,"outbound_source":null},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:creator","label":"Author","values":["Peak, Michael Samuel"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["1981"]},{"key":"dc:date.issued","label":"Date","values":["1981"]},{"key":"dc:publisher.department","label":"Dc Publisher Department","values":["Pure and Applied Physics"]},{"key":"dc:publisher.institution","label":"Dc Publisher Institution","values":["University of Salford"]},{"key":"dc:relation.isreferencedby","label":"Dc Relation Isreferencedby","values":["https://knowledge.lancashire.ac.uk/id/eprint/20361/"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.qualificationlevel","label":"Dc Type Qualificationlevel","values":["masters"]},{"key":"dc:type.qualificationname","label":"Dc Type Qualificationname","values":["msc"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["F310 - Applied physics"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://knowledge.lancashire.ac.uk/id/eprint/20361/1/20361%20Michael%20S.%20Peak%201981%20Analysis%20and%20Simulation%20of%20Neutron%20Diffraction%20Patterns%20Degree%20of%20Master%20of%20Science%20unpublished%201981%20University%20of%20Central%20Lancashire%20physics%20157.pdf"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["The analysis of neutron diffraction powder patterns and the simulation of single crystal oscillation patterns is described. The main factors governing the position and intensity of the coherent diffraction peaks and the factors contributing to the background level of scattered radiation in the diffraction pattern are discussed. Computer programs are described which have been used to reduce the raw data producedby a multicounter powder diffractometer, such as the DIDO Curran instrwnent at AEBE, Harwell, into a single normalised count against angle; to detect peaks in the normalised data, to calculate their intensity and to separate the peaks from the background so that further analysis can be performed separately on the peaks and background of the pattern. The locations of diffraction spots produced on a single crystal oscillation X ray or neutron di!ffraction photograph are calculated and the pattern is simulated to asSist the interpretation of magnetic and chemical structures. Comparison is made with data obtained from the D12 neutron oscillation camera facility at the Institut Max Von Laue, Paul Langevin, Grenoble."]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Analysis and simulation of neutron diffraction patterns"]}]}],"canonical_facts":{"dc:creator":["Peak, Michael Samuel"],"dc:date":["1981"],"dc:date.issued":["1981"],"dc:description.abstract":["The analysis of neutron diffraction powder patterns and the simulation of single crystal oscillation patterns is described. The main factors governing the position and intensity of the coherent diffraction peaks and the factors contributing to the background level of scattered radiation in the diffraction pattern are discussed. Computer programs are described which have been used to reduce the raw data producedby a multicounter powder diffractometer, such as the DIDO Curran instrwnent at AEBE, Harwell, into a single normalised count against angle; to detect peaks in the normalised data, to calculate their intensity and to separate the peaks from the background so that further analysis can be performed separately on the peaks and background of the pattern. The locations of diffraction spots produced on a single crystal oscillation X ray or neutron di!ffraction photograph are calculated and the pattern is simulated to asSist the interpretation of magnetic and chemical structures. Comparison is made with data obtained from the D12 neutron oscillation camera facility at the Institut Max Von Laue, Paul Langevin, Grenoble."],"dc:format":["application/pdf"],"dc:identifier.uri":["https://knowledge.lancashire.ac.uk/id/eprint/20361/1/20361%20Michael%20S.%20Peak%201981%20Analysis%20and%20Simulation%20of%20Neutron%20Diffraction%20Patterns%20Degree%20of%20Master%20of%20Science%20unpublished%201981%20University%20of%20Central%20Lancashire%20physics%20157.pdf"],"dc:language":["en"],"dc:publisher.department":["Pure and Applied Physics"],"dc:publisher.institution":["University of Salford"],"dc:relation.isreferencedby":["https://knowledge.lancashire.ac.uk/id/eprint/20361/"],"dc:subject":["F310 - Applied physics"],"dc:title":["Analysis and simulation of neutron diffraction patterns"],"dc:type":["Thesis"],"dc:type.qualificationlevel":["masters"],"dc:type.qualificationname":["msc"]},"updated_at":"2026-07-24T01:36:10Z"}