{"id":{"repo_id":"cape-town","oai_identifier":"oai:open.uct.ac.za:11427/8778"},"canonical_url":"https://search.dev.ndltd.org/etd/cape-town/oai:open.uct.ac.za:11427/8778","repository":{"repo_id":"cape-town","name":"University of Cape Town","base_url":"https://open.uct.ac.za/oai/request"},"display":{"title":"Residual stress in Pt coatings under thermal influence","abstract":"Resistance thermometers are commonly employed when accurate temperature measurements are required. The detection part consists of a thin metallic film deposited on a ceramic substrate. In this work, commercially manufactured Pt-Al₂O₃ composites annealed at 0°C, 300°C, 600°C and 1170°C above room temperature were investigated for residual stress using the non-destructive X-ray diffraction technique. The apparatus used for the investigation was a Ψ-goniometer with a scintillation detector. The measured data were analysed with \"sin²Ψ\"-method. The total stress yielded was found to be a superposition of both the thermal and intrinsic stress in the layer. Analytical model, following the method of Tsui and Clyne, was used to resolve the two stress contributions. With the thermal component being constant, the variation of the observed total stress was attributed to the relaxing intrinsic components. Further investigations of the samples included the microstructure studies using Scanning Electron Microscopy (SEM).","abstract_html":"Resistance thermometers are commonly employed when accurate temperature measurements are required. The detection part consists of a thin metallic film deposited on a ceramic substrate. In this work, commercially manufactured Pt-Al₂O₃ composites annealed at 0°C, 300°C, 600°C and 1170°C above room temperature were investigated for residual stress using the non-destructive X-ray diffraction technique. The apparatus used for the investigation was a Ψ-goniometer with a scintillation detector. The measured data were analysed with "sin²Ψ"-method. The total stress yielded was found to be a superposition of both the thermal and intrinsic stress in the layer. Analytical model, following the method of Tsui and Clyne, was used to resolve the two stress contributions. With the thermal component being constant, the variation of the observed total stress was attributed to the relaxing intrinsic components. Further investigations of the samples included the microstructure studies using Scanning Electron Microscopy (SEM).","abstract_has_math":false,"creators":["Ntsoane, T P"],"institution":"Department of Physics","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":["Härting, Margit"],"committee_chairs":[],"committee_members":[],"year":2001,"date_issued":"2001","date_published":"2001","updated_at":"2026-07-22T22:22:50Z","subjects":[],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/11427/8778","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Härting, Margit"]},{"key":"dc:creator","label":"Author","values":["Ntsoane, T P"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2014-10-25T18:59:51Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2014-10-25T18:59:51Z"]},{"key":"dc:date.issued","label":"Date","values":["2001"]},{"key":"dc:publisher.department","label":"Dc Publisher Department","values":["Department of Physics"]},{"key":"dc:publisher.institution","label":"Dc Publisher Institution","values":["University of Cape Town"]},{"key":"dc:type","label":"Dc Type","values":["Master Thesis"]},{"key":"dc:type.qualificationlevel","label":"Dc Type Qualificationlevel","values":["Masters"]},{"key":"dc:type.qualificationname","label":"Dc Type Qualificationname","values":["MSc"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/11427/8778"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Includes bibliographical references."]},{"key":"dc:description.abstract","label":"Abstract","values":["Resistance thermometers are commonly employed when accurate temperature measurements are required. The detection part consists of a thin metallic film deposited on a ceramic substrate. In this work, commercially manufactured Pt-Al₂O₃ composites annealed at 0°C, 300°C, 600°C and 1170°C above room temperature were investigated for residual stress using the non-destructive X-ray diffraction technique. The apparatus used for the investigation was a Ψ-goniometer with a scintillation detector. The measured data were analysed with \"sin²Ψ\"-method. The total stress yielded was found to be a superposition of both the thermal and intrinsic stress in the layer. Analytical model, following the method of Tsui and Clyne, was used to resolve the two stress contributions. With the thermal component being constant, the variation of the observed total stress was attributed to the relaxing intrinsic components. Further investigations of the samples included the microstructure studies using Scanning Electron Microscopy (SEM)."]},{"key":"dc:title","label":"Title","values":["Residual stress in Pt coatings under thermal influence"]}]}],"canonical_facts":{"dc:contributor.advisor":["Härting, Margit"],"dc:creator":["Ntsoane, T P"],"dc:date.accessioned":["2014-10-25T18:59:51Z"],"dc:date.available":["2014-10-25T18:59:51Z"],"dc:date.issued":["2001"],"dc:description":["Includes bibliographical references."],"dc:description.abstract":["Resistance thermometers are commonly employed when accurate temperature measurements are required. The detection part consists of a thin metallic film deposited on a ceramic substrate. In this work, commercially manufactured Pt-Al₂O₃ composites annealed at 0°C, 300°C, 600°C and 1170°C above room temperature were investigated for residual stress using the non-destructive X-ray diffraction technique. The apparatus used for the investigation was a Ψ-goniometer with a scintillation detector. The measured data were analysed with \"sin²Ψ\"-method. The total stress yielded was found to be a superposition of both the thermal and intrinsic stress in the layer. Analytical model, following the method of Tsui and Clyne, was used to resolve the two stress contributions. With the thermal component being constant, the variation of the observed total stress was attributed to the relaxing intrinsic components. Further investigations of the samples included the microstructure studies using Scanning Electron Microscopy (SEM)."],"dc:identifier.uri":["http://hdl.handle.net/11427/8778"],"dc:language.iso":["eng"],"dc:publisher.department":["Department of Physics"],"dc:publisher.institution":["University of Cape Town"],"dc:title":["Residual stress in Pt coatings under thermal influence"],"dc:type":["Master Thesis"],"dc:type.qualificationlevel":["Masters"],"dc:type.qualificationname":["MSc"]},"updated_at":"2026-07-22T22:22:50Z"}