{"id":{"repo_id":"cape-town","oai_identifier":"oai:open.uct.ac.za:11427/6522"},"canonical_url":"https://search.dev.ndltd.org/etd/cape-town/oai:open.uct.ac.za:11427/6522","repository":{"repo_id":"cape-town","name":"University of Cape Town","base_url":"https://open.uct.ac.za/oai/request"},"display":{"title":"Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques","abstract":"In this work, investigation of light elements incorporated in the amorphous silicon network of hydrogenated and nanocrystalline silicon were analysed by using ion beam analytical techniques. To do this, amorphous silicon films were deposited by hot wire chemical vapour deposition, and a unique sampling method was developed for the analysis of nanocrystalline silicon powder. The combinations of non destructive, quantitative and sensitive Rutherford backscattering, resonance scattering and elastic recoil detection analysis were used in analysing these samples.","abstract_html":"In this work, investigation of light elements incorporated in the amorphous silicon network of hydrogenated and nanocrystalline silicon were analysed by using ion beam analytical techniques. To do this, amorphous silicon films were deposited by hot wire chemical vapour deposition, and a unique sampling method was developed for the analysis of nanocrystalline silicon powder. The combinations of non destructive, quantitative and sensitive Rutherford backscattering, resonance scattering and elastic recoil detection analysis were used in analysing these samples.","abstract_has_math":false,"creators":["Adegbite, Olusegun"],"institution":"Department of Physics","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2006,"date_issued":"2006","date_published":"2006","updated_at":"2026-07-24T01:34:16Z","subjects":[],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/11427/6522","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:creator","label":"Author","values":["Adegbite, Olusegun"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2014-08-13T20:03:37Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2014-08-13T20:03:37Z"]},{"key":"dc:date.issued","label":"Date","values":["2006"]},{"key":"dc:publisher.department","label":"Dc Publisher Department","values":["Department of Physics"]},{"key":"dc:publisher.institution","label":"Dc Publisher Institution","values":["University of Cape Town"]},{"key":"dc:type","label":"Dc Type","values":["Master Thesis"]},{"key":"dc:type.qualificationlevel","label":"Dc Type Qualificationlevel","values":["Masters"]},{"key":"dc:type.qualificationname","label":"Dc Type Qualificationname","values":["M Sc"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/11427/6522"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Word processed copy.","Includes bibliographical references (leaves 83-87)."]},{"key":"dc:description.abstract","label":"Abstract","values":["In this work, investigation of light elements incorporated in the amorphous silicon network of hydrogenated and nanocrystalline silicon were analysed by using ion beam analytical techniques. To do this, amorphous silicon films were deposited by hot wire chemical vapour deposition, and a unique sampling method was developed for the analysis of nanocrystalline silicon powder. The combinations of non destructive, quantitative and sensitive Rutherford backscattering, resonance scattering and elastic recoil detection analysis were used in analysing these samples."]},{"key":"dc:title","label":"Title","values":["Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques"]}]}],"canonical_facts":{"dc:creator":["Adegbite, Olusegun"],"dc:date.accessioned":["2014-08-13T20:03:37Z"],"dc:date.available":["2014-08-13T20:03:37Z"],"dc:date.issued":["2006"],"dc:description":["Word processed copy.","Includes bibliographical references (leaves 83-87)."],"dc:description.abstract":["In this work, investigation of light elements incorporated in the amorphous silicon network of hydrogenated and nanocrystalline silicon were analysed by using ion beam analytical techniques. To do this, amorphous silicon films were deposited by hot wire chemical vapour deposition, and a unique sampling method was developed for the analysis of nanocrystalline silicon powder. The combinations of non destructive, quantitative and sensitive Rutherford backscattering, resonance scattering and elastic recoil detection analysis were used in analysing these samples."],"dc:identifier.uri":["http://hdl.handle.net/11427/6522"],"dc:language.iso":["eng"],"dc:publisher.department":["Department of Physics"],"dc:publisher.institution":["University of Cape Town"],"dc:title":["Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques"],"dc:type":["Master Thesis"],"dc:type.qualificationlevel":["Masters"],"dc:type.qualificationname":["M Sc"]},"updated_at":"2026-07-24T01:34:16Z"}