{"id":{"repo_id":"cape-town","oai_identifier":"oai:open.uct.ac.za:11427/6515"},"canonical_url":"https://search.dev.ndltd.org/etd/cape-town/oai:open.uct.ac.za:11427/6515","repository":{"repo_id":"cape-town","name":"University of Cape Town","base_url":"https://open.uct.ac.za/oai/request"},"display":{"title":"Changes in the near-surface stress in titanium caused by krypton ion-implantation","abstract":"In this work, the effect of krypton implantation on the morphology of titanium samples is investigated through scanning electron microscopy (SEM). Rutherford backscattering spectrometry (RBS) was also used to determine the dose and depth of implanted krypton. The krypton profiile in titanium, and the associated damage profile, was modelled with TRIM calculations. In addition, metallurgical techniques were also used to examine the microstructure details of the as-received, unimplanted titanium sample.","abstract_html":"In this work, the effect of krypton implantation on the morphology of titanium samples is investigated through scanning electron microscopy (SEM). Rutherford backscattering spectrometry (RBS) was also used to determine the dose and depth of implanted krypton. The krypton profiile in titanium, and the associated damage profile, was modelled with TRIM calculations. In addition, metallurgical techniques were also used to examine the microstructure details of the as-received, unimplanted titanium sample.","abstract_has_math":false,"creators":["Tunde, Raji Abdulrafiu"],"institution":"Department of Physics","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2006,"date_issued":"2006","date_published":"2006","updated_at":"2026-07-22T22:23:47Z","subjects":[],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/11427/6515","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:creator","label":"Author","values":["Tunde, Raji Abdulrafiu"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2014-08-13T20:03:28Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2014-08-13T20:03:28Z"]},{"key":"dc:date.issued","label":"Date","values":["2006"]},{"key":"dc:publisher.department","label":"Dc Publisher Department","values":["Department of Physics"]},{"key":"dc:publisher.institution","label":"Dc Publisher Institution","values":["University of Cape Town"]},{"key":"dc:type","label":"Dc Type","values":["Master Thesis"]},{"key":"dc:type.qualificationlevel","label":"Dc Type Qualificationlevel","values":["Masters"]},{"key":"dc:type.qualificationname","label":"Dc Type Qualificationname","values":["MSc"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/11427/6515"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Word processed copy.","Includes bibliographical references."]},{"key":"dc:description.abstract","label":"Abstract","values":["In this work, the effect of krypton implantation on the morphology of titanium samples is investigated through scanning electron microscopy (SEM). Rutherford backscattering spectrometry (RBS) was also used to determine the dose and depth of implanted krypton. The krypton profiile in titanium, and the associated damage profile, was modelled with TRIM calculations. In addition, metallurgical techniques were also used to examine the microstructure details of the as-received, unimplanted titanium sample."]},{"key":"dc:title","label":"Title","values":["Changes in the near-surface stress in titanium caused by krypton ion-implantation"]}]}],"canonical_facts":{"dc:creator":["Tunde, Raji Abdulrafiu"],"dc:date.accessioned":["2014-08-13T20:03:28Z"],"dc:date.available":["2014-08-13T20:03:28Z"],"dc:date.issued":["2006"],"dc:description":["Word processed copy.","Includes bibliographical references."],"dc:description.abstract":["In this work, the effect of krypton implantation on the morphology of titanium samples is investigated through scanning electron microscopy (SEM). Rutherford backscattering spectrometry (RBS) was also used to determine the dose and depth of implanted krypton. The krypton profiile in titanium, and the associated damage profile, was modelled with TRIM calculations. In addition, metallurgical techniques were also used to examine the microstructure details of the as-received, unimplanted titanium sample."],"dc:identifier.uri":["http://hdl.handle.net/11427/6515"],"dc:language.iso":["eng"],"dc:publisher.department":["Department of Physics"],"dc:publisher.institution":["University of Cape Town"],"dc:title":["Changes in the near-surface stress in titanium caused by krypton ion-implantation"],"dc:type":["Master Thesis"],"dc:type.qualificationlevel":["Masters"],"dc:type.qualificationname":["MSc"]},"updated_at":"2026-07-22T22:23:47Z"}