Reduced exposure time as a method of minimising the impact of vibration on electronic speckle pattern interferometry

Rowland, David J Reid

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Department of Mechanical Engineering

Reduced exposure time as a method of minimising the impact of vibration on electronic speckle pattern interferometry

dc:creator Rowland, David J Reid

dc:date.issued2002

Abstract

dc:description.abstract

Includes bibliographical references.

Degree

thesis:*

Grantor dc:publisher.institution: Department of Mechanical Engineering
Year dc:date.issued: 2002

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Rowland, David J Reid
Advisors dc:contributor.advisor: Findeis, Dirk
Gryzagoridis, Jasson

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Language dc:language.iso: eng

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dc:identifier.*

Handle dc:identifier.uri: http://hdl.handle.net/11427/5475
OAI identifier oai:identifier: oai:open.uct.ac.za:11427/5475

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Harvested from: University of Cape Town
Base URL: open.uct.ac.za/oai/request
Last updated: 2026-07-22
Source record: OAI-PMH GetRecord

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Rowland, David J Reid. Reduced exposure time as a method of minimising the impact of vibration on electronic speckle pattern interferometry. Department of Mechanical Engineering, 2002. http://hdl.handle.net/11427/5475

Reduced exposure time as a method of minimising the impact of vibration on electronic speckle pattern interferometry

Abstract

Degree

Author and committee

Rights

Identifiers

Chain of custody

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