Banking regulation: a Bayesian network approach to risk management

The ever-evolving regulation surrounding banks and market risk, coupled with increased computing power, make for favourable conditions in employing machine learning techniques to estimate and forecast market risk metrics such as value at risk (VaR) and expected shortfall (ES). This study consists of three sections. First, this study comprehensively examines the performance of various market risk models when producing VaR and ES, and their stressed counterparts, using Standard and Poor's (S&P) 500 index returns from 1991 to 2020. The initial results show that autoregressive models are the most accurate of the traditional market risk models. Second, the first section's results are then used as the basis against which a novel and comprehensive Bayesian network (BN) methodology for producing VaR and ES forecasts, and those of their stressed counterparts, is assessed in the context of banking regulations, using four learning algorithms. The forecasts generated by the BNs are not found to offer any improved accuracy when incorporated into the market risk metric calculations, primarily due to the limited weight of the forecast in the return distribution relative to the historical returns in the return probability density function. Finally, a novel integrated forecast dynamic Bayesian network (IFDBN) methodology is developed, whereby, for each metric, the best-in-class autoregressive model and the best-in-class BN learning algorithm are coupled to produce market risk forecasts. The results of the IFDBNs are mixed, with the stressed ES metric IFDBN being the only IFDBN to produce more accurate forecasts relative to its traditional autoregressive counterpart. While certain market risk metrics may benefit from using IFDBNs in the forecasting process, this result is not universal, and the risk practitioner must evaluate the usefulness of IFDBNs on a case-by-case basis.

Grantor dc:publisher.institution

Department of Finance and Tax

Year dc:date.issued

2025

Author dc:creator

• Gross, Eden

Advisors dc:contributor.advisor

• Kruger, Ryan
• Toerien, Francois

• banks
• market risk
• value at risk
• VaR
• expected shortfall, ES

Handle dc:identifier.uri

http://hdl.handle.net/11427/42257

OAI identifier oai:identifier

oai:open.uct.ac.za:11427/42257