Robust electronic circuit design using evolutionary and Taguchi methods

In engineering, there is a wide range of applications where genetic optimizers are used. Two genetic optimizers used in this thesis namely, Population Based Incremental Learning ( PBIL ) and Cross generational selection Heterogeneous crossover Cataclysmic mutation ( CHC ), are tested on a series of circuit problems to fmd if robust electronic circuits can be built from evolutionary methods. The evolutionary algorithms were used to search the space of discrete component values from a range of manufactured preferred values to obtain robust electronic circuits. Parasitic effects were also modelled in the simulation to provide for a more realistic circuit.

Grantor dc:publisher.institution

Department of Electrical Engineering

Year dc:date.issued

1997

Author dc:creator

• Owadally, Muhammud Asaad

Advisor dc:contributor.advisor

• Greene, John R

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/11427/21761

OAI identifier oai:identifier

oai:open.uct.ac.za:11427/21761