{"id":{"repo_id":"cape-town","oai_identifier":"oai:open.uct.ac.za:11427/11812"},"canonical_url":"https://search.dev.ndltd.org/etd/cape-town/oai:open.uct.ac.za:11427/11812","repository":{"repo_id":"cape-town","name":"University of Cape Town","base_url":"https://open.uct.ac.za/oai/request"},"display":{"title":"The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium","abstract":"Stress migration of point and open-volume defects in materials is an important problem in a wide variety of applications, such as degradation of metallic interconnects in semiconductor devices, metal fatigue, and radiation damage profiles in ion implantation and surface modification. From a fundamental research view point, this study aims to contribute to a better understanding of the basic processes underlying the effect of stress assisted diffusion of foreign interstitial atoms under stress fields, using the Rutherford backscattering to obtain depth profiles, and synchroton radiation diffraction for the determination of stress fields. This has been achieved by creating a well designed model system of krypton implanted polycrystalline titanium.","abstract_html":"Stress migration of point and open-volume defects in materials is an important problem in a wide variety of applications, such as degradation of metallic interconnects in semiconductor devices, metal fatigue, and radiation damage profiles in ion implantation and surface modification. From a fundamental research view point, this study aims to contribute to a better understanding of the basic processes underlying the effect of stress assisted diffusion of foreign interstitial atoms under stress fields, using the Rutherford backscattering to obtain depth profiles, and synchroton radiation diffraction for the determination of stress fields. This has been achieved by creating a well designed model system of krypton implanted polycrystalline titanium.","abstract_has_math":false,"creators":["Nsengiyumva, Schadrack"],"institution":"Department of Physics","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":["Härting, Margit","Britton, David T"],"committee_chairs":[],"committee_members":[],"year":2008,"date_issued":"2008","date_published":"2008","updated_at":"2026-07-22T22:23:26Z","subjects":[],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/11427/11812","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Härting, Margit","Britton, David T"]},{"key":"dc:creator","label":"Author","values":["Nsengiyumva, Schadrack"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2015-01-08T20:07:17Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2015-01-08T20:07:17Z"]},{"key":"dc:date.issued","label":"Date","values":["2008"]},{"key":"dc:publisher.department","label":"Dc Publisher Department","values":["Department of Physics"]},{"key":"dc:publisher.institution","label":"Dc Publisher Institution","values":["University of Cape Town"]},{"key":"dc:type","label":"Dc Type","values":["Doctoral Thesis"]},{"key":"dc:type.qualificationlevel","label":"Dc Type Qualificationlevel","values":["Doctoral"]},{"key":"dc:type.qualificationname","label":"Dc Type Qualificationname","values":["PhD"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/11427/11812"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Includes abstract.","Includes bibliographical references (leaves 155-182)."]},{"key":"dc:description.abstract","label":"Abstract","values":["Stress migration of point and open-volume defects in materials is an important problem in a wide variety of applications, such as degradation of metallic interconnects in semiconductor devices, metal fatigue, and radiation damage profiles in ion implantation and surface modification. From a fundamental research view point, this study aims to contribute to a better understanding of the basic processes underlying the effect of stress assisted diffusion of foreign interstitial atoms under stress fields, using the Rutherford backscattering to obtain depth profiles, and synchroton radiation diffraction for the determination of stress fields. This has been achieved by creating a well designed model system of krypton implanted polycrystalline titanium."]},{"key":"dc:title","label":"Title","values":["The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium"]}]}],"canonical_facts":{"dc:contributor.advisor":["Härting, Margit","Britton, David T"],"dc:creator":["Nsengiyumva, Schadrack"],"dc:date.accessioned":["2015-01-08T20:07:17Z"],"dc:date.available":["2015-01-08T20:07:17Z"],"dc:date.issued":["2008"],"dc:description":["Includes abstract.","Includes bibliographical references (leaves 155-182)."],"dc:description.abstract":["Stress migration of point and open-volume defects in materials is an important problem in a wide variety of applications, such as degradation of metallic interconnects in semiconductor devices, metal fatigue, and radiation damage profiles in ion implantation and surface modification. From a fundamental research view point, this study aims to contribute to a better understanding of the basic processes underlying the effect of stress assisted diffusion of foreign interstitial atoms under stress fields, using the Rutherford backscattering to obtain depth profiles, and synchroton radiation diffraction for the determination of stress fields. This has been achieved by creating a well designed model system of krypton implanted polycrystalline titanium."],"dc:identifier.uri":["http://hdl.handle.net/11427/11812"],"dc:language.iso":["eng"],"dc:publisher.department":["Department of Physics"],"dc:publisher.institution":["University of Cape Town"],"dc:title":["The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium"],"dc:type":["Doctoral Thesis"],"dc:type.qualificationlevel":["Doctoral"],"dc:type.qualificationname":["PhD"]},"updated_at":"2026-07-22T22:23:26Z"}