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University of Cambridge

Charge density determination in semiconductors and other materials by electron diffraction.

dc:creator Burgess, William George

dc:type.qualificationname Doctor of Philosophy (PhD)

dc:date.issued1995

Degree

thesis:*

Name dc:type.qualificationname: Doctor of Philosophy (PhD)
Level dc:type.qualificationlevel: Doctoral
Grantor dc:publisher.institution: University of Cambridge
Year dc:date.issued: 1995

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Burgess, William George

Rights

dc:rights

Licence: https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/e7894f16-621e-4869-a1b6-77db0efb4edc/download

https://www.rioxx.net/licenses/all-rights-reserved/

https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/fc008a66-e59e-43e9-9589-cd1dbb326ba2/download
Language dc:language: eng

Identifiers

dc:identifier.*

DOI dc:identifier.doi: https://doi.org/10.17863/CAM.22436
OAI identifier oai:identifier: oai:www.repository.cam.ac.uk:1810/275257

Chain of custody

source

Harvested from: Cambridge University
Base URL: api.repository.cam.ac.uk/server/oai/request
Last updated: 2026-07-22
Source record: OAI-PMH GetRecord

related terms

citation

Burgess, William George. Charge density determination in semiconductors and other materials by electron diffraction.. Doctoral thesis, University of Cambridge, 1995. https://doi.org/10.17863/CAM.22436

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