{"id":{"repo_id":"cambridge","oai_identifier":"oai:www.repository.cam.ac.uk:1810/265306"},"canonical_url":"https://search.dev.ndltd.org/etd/cambridge/oai:www.repository.cam.ac.uk:1810/265306","repository":{"repo_id":"cambridge","name":"Cambridge University","base_url":"https://api.repository.cam.ac.uk/server/oai/request"},"display":{"title":"Long wavelength X-ray microanalysis","abstract":"This dissertation describes some new methods for discrimina'ting between the light element characteristic wavelengths in an x-ray scanning microanalyser. For long wavelength microanalysis purposes, the classica1 methods of x-ray spectrometr.v are impracticable. The proportional counter, the best of several possibilities, has there~ore been employed as a dispersive detector, the output pulses subsequently being fu\"'1.alysed electronically to yield the necessar.v line intensity information. Proportional counter operation with low energy x-rays is analysed and discussed, and the construction of a suitable counter is described � .Measurements of the quantum yields from carbon and aluminium, . made with this counter, are reported; these measurements, apart from their :fundamental significance., provide an estimate of the performance to be expected from a light element microanalyser. � Several methods of pulse height distribution analysis (deconvolution) are described practically a'tld analysed theoretically. One of the methods, in which the outputs from several pulse anal.yser channels are treated as a set of linear equations which can be solved simultaneously in an electrica1 network, is chosen for development and incorporation into a scanning microanalyser. The design., constrv.ction1 Elld operation of this instrument are described; i ts use is demonstrated 1n several practical examples. The results are presented ElS pictures. with r3solution of 4-5 mi.crons1 showing the surface concentrations of elements as light as beryllium {Z = 4). \\","abstract_html":"This dissertation describes some new methods for discrimina'ting between the light element characteristic wavelengths in an x-ray scanning microanalyser. For long wavelength microanalysis purposes, the classica1 methods of x-ray spectrometr.v are impracticable. The proportional counter, the best of several possibilities, has there~ore been employed as a dispersive detector, the output pulses subsequently being fu"'1.alysed electronically to yield the necessar.v line intensity information. Proportional counter operation with low energy x-rays is analysed and discussed, and the construction of a suitable counter is described � .Measurements of the quantum yields from carbon and aluminium, . made with this counter, are reported; these measurements, apart from their :fundamental significance., provide an estimate of the performance to be expected from a light element microanalyser. � Several methods of pulse height distribution analysis (deconvolution) are described practically a'tld analysed theoretically. One of the methods, in which the outputs from several pulse anal.yser channels are treated as a set of linear equations which can be solved simultaneously in an electrica1 network, is chosen for development and incorporation into a scanning microanalyser. The design., constrv.ction1 Elld operation of this instrument are described; i ts use is demonstrated 1n several practical examples. The results are presented ElS pictures. with r3solution of 4-5 mi.crons1 showing the surface concentrations of elements as light as beryllium {Z = 4). \\","abstract_has_math":false,"creators":["Dolby, Ray Milton"],"institution":"University of Cambridge","degree_name":"Doctor of Philosophy (PhD)","degree_level":"Doctoral","degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1962,"date_issued":"1962-08-23","date_published":"1962-08-23","updated_at":"2026-07-22T22:24:21Z","subjects":[],"languages":["eng"],"rights":[],"rights_urls":["https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/9a400c72-fbc0-477a-8773-bdbc9d0a8704/download","https://www.rioxx.net/licenses/all-rights-reserved/"],"identifier_entries":[]},"links":{"outbound_url":"https://doi.org/10.17863/CAM.11458","outbound_label":"DOI","outbound_source":"dc:identifier.doi"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:creator","label":"Author","values":["Dolby, Ray Milton"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.issued","label":"Date","values":["1962-08-23"]},{"key":"dc:publisher.institution","label":"Dc Publisher Institution","values":["University of Cambridge"]},{"key":"dc:relation.isreferencedby.uri","label":"Dc Relation Isreferencedby URI","values":["https://www.repository.cam.ac.uk/handle/1810/265306"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.qualificationlevel","label":"Dc Type Qualificationlevel","values":["Doctoral"]},{"key":"dc:type.qualificationname","label":"Dc Type Qualificationname","values":["Doctor of Philosophy (PhD)"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/9a400c72-fbc0-477a-8773-bdbc9d0a8704/download","https://www.rioxx.net/licenses/all-rights-reserved/"]},{"key":"dc:rights.embargotype","label":"Dc Rights Embargotype","values":["controlled.access"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.doi","label":"DOI","values":["10.17863/CAM.11458"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["This dissertation describes some new methods for discrimina'ting between the light element characteristic wavelengths in an x-ray scanning microanalyser. 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One of the methods, in which the outputs from several pulse anal.yser channels are treated as a set of linear equations which can be solved simultaneously in an electrica1 network, is chosen for development and incorporation into a scanning microanalyser. The design., constrv.ction1 Elld operation of this instrument are described; i ts use is demonstrated 1n several practical examples. 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