{"id":{"repo_id":"buffalo","oai_identifier":"oai:ubir.buffalo.edu:10477/84014"},"canonical_url":"https://search.dev.ndltd.org/etd/buffalo/oai:ubir.buffalo.edu:10477/84014","repository":{"repo_id":"buffalo","name":"Buffalo","base_url":"https://ubir.buffalo.edu/oai/request"},"display":{"title":"Quantifying Analyte-Porous Silicon Interactions","abstract":"Ph.D.","abstract_html":"Ph.D.","abstract_has_math":false,"creators":["Darlow, Ari; 0000-0001-6868-673X"],"institution":"State University of New York at Buffalo","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":["Bright, Frank","Chemistry"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2022,"date_issued":"2022-06-21T15:47:03Z","date_published":"2022-06-21T15:47:03Z","updated_at":"2026-07-27T19:05:28Z","subjects":["analytical chemistry","materials science"],"languages":["eng"],"rights":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/10477/84014","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Bright, Frank","Chemistry"]},{"key":"dc:creator","label":"Author","values":["Darlow, Ari; 0000-0001-6868-673X"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2022-06-21T15:47:03Z","2020"]},{"key":"dc:publisher","label":"Institution","values":["State University of New York at Buffalo"]},{"key":"dc:type","label":"Dc Type","values":["Text","Dissertation"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["analytical chemistry","materials science"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/10477/84014"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Ph.D.","This dissertation discusses analyte-dependent responses using porous silicon (pSi) as a medium. This research demonstrates how analytes affect intrinsic pSi photoluminescence emission (PLE). Toluene and methanol quench pSi PLE, while nitromethane enhances pSi PLE. Fourier transform infrared (FTIR) spectroscopy is performed to analyze how these analytes affect pSi surface functional groups and oscillator strengths. Single point Raman microscopy is used to determine how these analytes influence the silicon nanocrystal (SiNC) lattice stress. Depth dependent Raman microscopy is utilized to determine how these analytes affect SiNC stress as a function of depth.","**To request an accessible version of the file(s) associated with this item, contact library@buffalo.edu. Please include the item's persistent URL [http://hdl.handle.net/. . .] in your request.**"]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Quantifying Analyte-Porous Silicon Interactions"]}]}],"canonical_facts":{"dc:contributor":["Bright, Frank","Chemistry"],"dc:creator":["Darlow, Ari; 0000-0001-6868-673X"],"dc:date":["2022-06-21T15:47:03Z","2020"],"dc:description":["Ph.D.","This dissertation discusses analyte-dependent responses using porous silicon (pSi) as a medium. This research demonstrates how analytes affect intrinsic pSi photoluminescence emission (PLE). Toluene and methanol quench pSi PLE, while nitromethane enhances pSi PLE. Fourier transform infrared (FTIR) spectroscopy is performed to analyze how these analytes affect pSi surface functional groups and oscillator strengths. Single point Raman microscopy is used to determine how these analytes influence the silicon nanocrystal (SiNC) lattice stress. Depth dependent Raman microscopy is utilized to determine how these analytes affect SiNC stress as a function of depth.","**To request an accessible version of the file(s) associated with this item, contact library@buffalo.edu. Please include the item's persistent URL [http://hdl.handle.net/. . .] in your request.**"],"dc:format":["application/pdf"],"dc:identifier":["http://hdl.handle.net/10477/84014"],"dc:language":["eng"],"dc:publisher":["State University of New York at Buffalo"],"dc:rights":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."],"dc:subject":["analytical chemistry","materials science"],"dc:title":["Quantifying Analyte-Porous Silicon Interactions"],"dc:type":["Text","Dissertation"]},"updated_at":"2026-07-27T19:05:28Z"}