{"id":{"repo_id":"buffalo","oai_identifier":"oai:ubir.buffalo.edu:10477/79315"},"canonical_url":"https://search.dev.ndltd.org/etd/buffalo/oai:ubir.buffalo.edu:10477/79315","repository":{"repo_id":"buffalo","name":"Buffalo","base_url":"https://ubir.buffalo.edu/oai/request"},"display":{"title":"Size-Dependent Elastic Behavior of Micro Scale Copper Beams","abstract":"Ph.D.","abstract_html":"Ph.D.","abstract_has_math":false,"creators":["Zhang, Haoyu; 0000-0002-4126-5617"],"institution":"State University of New York at Buffalo","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":["Dargush, Gary","Mechanical and Aerospace Engineering"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2019,"date_issued":"2019-04-04T17:41:58Z","date_published":"2019-04-04T17:41:58Z","updated_at":"2026-07-27T19:05:14Z","subjects":["mechanical engineering","size-dependent elastic effect","micro-scale structures","copper single crystal","consistent couple stress theory","atomic force microscopy (AFM)","focus ion beam (FIB)"],"languages":["eng"],"rights":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/10477/79315","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Dargush, Gary","Mechanical and Aerospace Engineering"]},{"key":"dc:creator","label":"Author","values":["Zhang, Haoyu; 0000-0002-4126-5617"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2019-04-04T17:41:58Z","2019","2019-01-18 22:09:58"]},{"key":"dc:publisher","label":"Institution","values":["State University of New York at Buffalo"]},{"key":"dc:type","label":"Dc Type","values":["Text","Dissertation"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["mechanical engineering","size-dependent elastic effect","micro-scale structures","copper single crystal","consistent couple stress theory","atomic force microscopy (AFM)","focus ion beam (FIB)"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/10477/79315"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Ph.D.","To investigate single crystal copper elastic behavior in micro-scale, microcantilevers with the beam axis having a [11 ̅0] orientation and thicknesses ranging from 5.41μm to 0.74μm were fabricated by focus ion beam (FIB) milling. Then, several series of indentation tests were performed by atomic force microscopy (AFM). According to the experimentally measured spring constants, significant size-dependent elastic behavior was observed, when the cantilever thickness is approximately 1μm or less for single crystal copper. An Euler-Bernoulli beam model based on consistent couple stress theory (C-CST) was applied to interpret this observed size effect. Instead of interpreting size-dependent behavior as a varying elastic modulus, an estimation of the length scale introduced in C-CST was made, resulting in a value in the range of 0.2μm-0.4μm. The corresponding couple stress coefficient η is determined qualitatively, which is estimated to be of order 10^3 μN in the current work."]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Size-Dependent Elastic Behavior of Micro Scale Copper Beams"]}]}],"canonical_facts":{"dc:contributor":["Dargush, Gary","Mechanical and Aerospace Engineering"],"dc:creator":["Zhang, Haoyu; 0000-0002-4126-5617"],"dc:date":["2019-04-04T17:41:58Z","2019","2019-01-18 22:09:58"],"dc:description":["Ph.D.","To investigate single crystal copper elastic behavior in micro-scale, microcantilevers with the beam axis having a [11 ̅0] orientation and thicknesses ranging from 5.41μm to 0.74μm were fabricated by focus ion beam (FIB) milling. Then, several series of indentation tests were performed by atomic force microscopy (AFM). According to the experimentally measured spring constants, significant size-dependent elastic behavior was observed, when the cantilever thickness is approximately 1μm or less for single crystal copper. An Euler-Bernoulli beam model based on consistent couple stress theory (C-CST) was applied to interpret this observed size effect. Instead of interpreting size-dependent behavior as a varying elastic modulus, an estimation of the length scale introduced in C-CST was made, resulting in a value in the range of 0.2μm-0.4μm. The corresponding couple stress coefficient η is determined qualitatively, which is estimated to be of order 10^3 μN in the current work."],"dc:format":["application/pdf"],"dc:identifier":["http://hdl.handle.net/10477/79315"],"dc:language":["eng"],"dc:publisher":["State University of New York at Buffalo"],"dc:rights":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."],"dc:subject":["mechanical engineering","size-dependent elastic effect","micro-scale structures","copper single crystal","consistent couple stress theory","atomic force microscopy (AFM)","focus ion beam (FIB)"],"dc:title":["Size-Dependent Elastic Behavior of Micro Scale Copper Beams"],"dc:type":["Text","Dissertation"]},"updated_at":"2026-07-27T19:05:14Z"}