{"id":{"repo_id":"buffalo","oai_identifier":"oai:ubir.buffalo.edu:10477/78627"},"canonical_url":"https://search.dev.ndltd.org/etd/buffalo/oai:ubir.buffalo.edu:10477/78627","repository":{"repo_id":"buffalo","name":"Buffalo","base_url":"https://ubir.buffalo.edu/oai/request"},"display":{"title":"Dynamic Comparator Based True Random Number Generator","abstract":"M.S.","abstract_html":"M.S.","abstract_has_math":false,"creators":["Gujarathi, Nimish Nitin; 0000-0002-4722-3346"],"institution":"State University of New York at Buffalo","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":["Sanyal, Arindam","Electrical Engineering"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2018,"date_issued":"2018-10-26T02:57:04Z","date_published":"2018-10-26T02:57:04Z","updated_at":"2026-07-27T19:05:14Z","subjects":["electrical engineering"],"languages":["eng"],"rights":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/10477/78627","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Sanyal, Arindam","Electrical Engineering"]},{"key":"dc:creator","label":"Author","values":["Gujarathi, Nimish Nitin; 0000-0002-4722-3346"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2018-10-26T02:57:04Z","2018","2018-08-10 14:05:13"]},{"key":"dc:publisher","label":"Institution","values":["State University of New York at Buffalo"]},{"key":"dc:type","label":"Dc Type","values":["Text","Thesis"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["electrical engineering"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/10477/78627"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["M.S.","True Random Number Generators (TRNG) are a significant part of security systems and they have been widely used to generate cryptographic keys for common cryptosystems that need to be truly random and unpredictable. The amount of randomness decides their vulnerability to unethical software attacks that can compromise system integrity. There are many types of TRNG depending on entropy source which are specific to purpose and application. In this work, we are focusing on a novel design of a dynamic comparator based TRNG whose source of entropy is metastability. This 65nm architecture exhibits randomness of a very high entropy of 0.9954 at 40Mbps bitrate when calibrated appropriately. The energy consumption is 0.15pJ/bit at 1V VDD which is lesser than a similar Digital RNG with a lower entropy."]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Dynamic Comparator Based True Random Number Generator"]}]}],"canonical_facts":{"dc:contributor":["Sanyal, Arindam","Electrical Engineering"],"dc:creator":["Gujarathi, Nimish Nitin; 0000-0002-4722-3346"],"dc:date":["2018-10-26T02:57:04Z","2018","2018-08-10 14:05:13"],"dc:description":["M.S.","True Random Number Generators (TRNG) are a significant part of security systems and they have been widely used to generate cryptographic keys for common cryptosystems that need to be truly random and unpredictable. The amount of randomness decides their vulnerability to unethical software attacks that can compromise system integrity. There are many types of TRNG depending on entropy source which are specific to purpose and application. In this work, we are focusing on a novel design of a dynamic comparator based TRNG whose source of entropy is metastability. This 65nm architecture exhibits randomness of a very high entropy of 0.9954 at 40Mbps bitrate when calibrated appropriately. The energy consumption is 0.15pJ/bit at 1V VDD which is lesser than a similar Digital RNG with a lower entropy."],"dc:format":["application/pdf"],"dc:identifier":["http://hdl.handle.net/10477/78627"],"dc:language":["eng"],"dc:publisher":["State University of New York at Buffalo"],"dc:rights":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."],"dc:subject":["electrical engineering"],"dc:title":["Dynamic Comparator Based True Random Number Generator"],"dc:type":["Text","Thesis"]},"updated_at":"2026-07-27T19:05:14Z"}