{"id":{"repo_id":"buffalo","oai_identifier":"oai:ubir.buffalo.edu:10477/78092"},"canonical_url":"https://search.dev.ndltd.org/etd/buffalo/oai:ubir.buffalo.edu:10477/78092","repository":{"repo_id":"buffalo","name":"Buffalo","base_url":"https://ubir.buffalo.edu/oai/request"},"display":{"title":"Misalignment detection in X-ray microtomographic imaging system","abstract":"Ph.D.","abstract_html":"Ph.D.","abstract_has_math":false,"creators":["Pornpojratanakul, Vinai"],"institution":"State University of New York at Buffalo","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":["Cheng, Ping-Chin","Electrical Engineering"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2018,"date_issued":"2018-06-28T20:33:57Z","date_published":"2018-06-28T20:33:57Z","updated_at":"2026-07-27T19:05:07Z","subjects":["electrical engineering"],"languages":["eng"],"rights":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/10477/78092","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Cheng, Ping-Chin","Electrical Engineering"]},{"key":"dc:creator","label":"Author","values":["Pornpojratanakul, Vinai"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2018-06-28T20:33:57Z","2018","2018-05-17 23:49:05"]},{"key":"dc:publisher","label":"Institution","values":["State University of New York at Buffalo"]},{"key":"dc:type","label":"Dc Type","values":["Text","Dissertation"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["electrical engineering"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/10477/78092"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Ph.D.","X-ray microtomography becomes a promising and effective tool in various fields of internal structure studies on micrometer scale. Its resolution has been developed to reach a level far beyond the ability of a conventional medical tomography. Behind successful progressions, the quality of reconstruction images in x-ray microtomography depends on correct parameters of the system. A system calibration is a required procedure in every scanning in order to derive system parameters for reconstruction process. Without accurate values of a parameter set, a reconstruction image may be distorted or severely unrecognizable. Although being equipped with precision assistance devices, a microtomography system has a limitation by its system mechanical precision. This dissertation proposes a potential method to identify a parameter causing a misalignment effect revealing on a reconstruction result. Instead of resolving parameters in the spatial domain, major misaligned situations of metal balls are extensively analyzed in the frequency domain. The simulation study performs with a metal-sphere marker and each misaligned parameter may show its unique pattern reflecting in both power spectrum and phase of the frequency response, so a pattern defines a value of a misaligned parameter. Once knowing an incorrect variable and its value, the reconstruction process is repeated to generate a new result with better accuracy. The simulation result of this dissertation shows a possibility to detect a misalignment of x-ray microtomography system and applying this idea can enhance its reconstruction images."]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Misalignment detection in X-ray microtomographic imaging system"]}]}],"canonical_facts":{"dc:contributor":["Cheng, Ping-Chin","Electrical Engineering"],"dc:creator":["Pornpojratanakul, Vinai"],"dc:date":["2018-06-28T20:33:57Z","2018","2018-05-17 23:49:05"],"dc:description":["Ph.D.","X-ray microtomography becomes a promising and effective tool in various fields of internal structure studies on micrometer scale. Its resolution has been developed to reach a level far beyond the ability of a conventional medical tomography. Behind successful progressions, the quality of reconstruction images in x-ray microtomography depends on correct parameters of the system. A system calibration is a required procedure in every scanning in order to derive system parameters for reconstruction process. Without accurate values of a parameter set, a reconstruction image may be distorted or severely unrecognizable. Although being equipped with precision assistance devices, a microtomography system has a limitation by its system mechanical precision. This dissertation proposes a potential method to identify a parameter causing a misalignment effect revealing on a reconstruction result. Instead of resolving parameters in the spatial domain, major misaligned situations of metal balls are extensively analyzed in the frequency domain. The simulation study performs with a metal-sphere marker and each misaligned parameter may show its unique pattern reflecting in both power spectrum and phase of the frequency response, so a pattern defines a value of a misaligned parameter. Once knowing an incorrect variable and its value, the reconstruction process is repeated to generate a new result with better accuracy. The simulation result of this dissertation shows a possibility to detect a misalignment of x-ray microtomography system and applying this idea can enhance its reconstruction images."],"dc:format":["application/pdf"],"dc:identifier":["http://hdl.handle.net/10477/78092"],"dc:language":["eng"],"dc:publisher":["State University of New York at Buffalo"],"dc:rights":["Users of works found in University at Buffalo Institutional Repository (UBIR) are responsible for identifying and contacting the copyright owner for permission to reuse. University at Buffalo Libraries do not manage rights for copyright-protected works and cannot assist with permissions.","Copyright retained by author."],"dc:subject":["electrical engineering"],"dc:title":["Misalignment detection in X-ray microtomographic imaging system"],"dc:type":["Text","Dissertation"]},"updated_at":"2026-07-27T19:05:07Z"}