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Universität Bielefeld
Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy
Degree
thesis:*- Level thesis:degree_level
- thesis.doctoral
- Grantor dc:publisher
- Universität Bielefeld
- Year
- 2021
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Büker, Björn
Identifiers
dc:identifier.*- Repository record source_url
- https://pub.uni-bielefeld.de/record/2959447
- OAI identifier oai:identifier
- oai:pub.uni-bielefeld.de:2959447