ANALYTICAL APPLICATIONS OF PARTICLE INDUCED X-RAY EMISSION (PIXE) SPECTROSCOPY

Quantitative multielemental analysis using Particle Induced X-ray Emission (PIXE) using 1 and 2 MeV proton bombardment on thin targets has been achieved. The method is based on the calculation of atomic ratios from experimentally determined relative x-ray efficiency curves. Sample preparation techniques involving digestion and homogenous deposition of samples and standards with a minimum of contamination have been investigated. The accuracy of the method has been evaluated using five standard reference materials obtained from the National Bureau of Standards. The elimination of bremsstrahlung associated with the charging effect of non-conducting samples in PIXE analysis has been accomplished using thin carbon foils in the beam path. Applications of the PIXE technique to studies on deep-sea ferromanganese nodules were performed. The utility of PIXE in the analysis of noduoles and in the following of the distribution of a large number of elements through the various stages of a processing scheme were demonstrated.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

doctoral

Discipline thesis:degree_discipline

Graduate College

Grantor dc:publisher

The University of Arizona.

Year dc:date.issued

1981

Author dc:creator

• Kirchner, Stephen John

Advisor dc:contributor.advisor

• Fernando, Quintus

• Manganese nodules -- Spectra.
• X-ray spectroscopy.

Statement dc:rights

• Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.

Language dc:language.iso

en_US

Handle dc:identifier.uri

http://hdl.handle.net/10150/282084

OAI identifier oai:identifier

oai:repository.arizona.edu:10150/282084