Imprint: an important failure mechanism of ferroelectric thin films in view of memory applications
type: CreativeWork
author: Grossmann, Michael
language: eng
date published: 2001
date modified: 2026-07-30T19:42:39Z
provider: RWTH Aachen University
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: VDI-Verl