Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie

Xu, Jun

Back to results

Mainz

Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie

dc:creator Xu, Jun

dc:date1999

Degree

thesis:*

Grantor dc:publisher: Mainz
Year dc:date: 1999

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Xu, Jun
Contributors dc:contributor: Grosse, Peter

Rights

dc:rights

Statement dc:rights: info:eu-repo/semantics/closedAccess
Language dc:language: ger

Identifiers

dc:identifier.*

Identifier: https://publications.rwth-aachen.de/search?p=id:%22RWTH-CONV-117629%22
OAI record oai:identifier: https://publications.rwth-aachen.de/oai2d?verb=GetRecord&metadataPrefix=oai_dc&identifier=oai%3Apublications.rwth-aachen.de%3A55490

Chain of custody

source

Harvested from: RWTH Aachen University
Base URL: publications.rwth-aachen.de/oai2d
Last updated: 2026-07-30
Source record: OAI-PMH GetRecord

related terms

aachen
1999

citation

Xu, Jun. Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie. Mainz, 1999. https://publications.rwth-aachen.de/record/55490

Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie

Degree

Author and committee

Rights

Identifiers

Chain of custody

More from RWTH Aachen University