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Showing 1 to 2 of 2 for “"trench defects"”.

  1. Development of Multi-Microscopy Techniques for the Characterisation of Nitride Semiconductors

    … typically contain a high density of extended defects, particularly threading dislocations (TDs). Despite the relative defect tolerance of these materials, it is important to understand how particular defects impact the electronic and optical properties. The direct correlation of measurements …

    cambridge Repository record for Development of Multi-Microscopy Techniques for the Characterisation of Nitride Semiconductors (opens in a new tab)

  2. Microscopy of porous nitride materials for long wavelength light emitting diodes

    … to be either linked to dislocation loops or trench defects or to be unconnected to an extended defect, serving as a route for strain relaxation by themselves. The strain-related electric field variation in the vicinity of small V-pits has been mapped by a differential phase contrast (DPC) …

    cambridge Repository record for Microscopy of porous nitride materials for long wavelength light emitting diodes (opens in a new tab)