Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 8 of 8 for “"transition fault"”.
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Experimental Study of Scan Based Transition Fault Testing Techniques
… test for such delay-inducing defects, scan-based transition fault testing techniques are being implemented. There exist organized techniques to generate test patterns for the transition fault model and the two popular methods being used are Broad-side delay test (Launch-from-capture) and Skewed …
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High Quality Transition and Small Delay Fault ATPG
… selection and generating tests for small delay faults is an important issue in the delay fault area. A novel technique for generating effective vectors for delay defects is the first issue that we have presented in the thesis. The test set achieves high path delay fault coverage to capture …
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TENOR: an ATPG for transition faults in combinational circuits
Delay fault testing of high speed VLSI circuits is becoming increasingly important. This thesis presents an Automatic Test Pattern Generator (ATPG), called TENOR, for transition faults. Transition faults are a special case of gate delay faults. Test generation is based on the FAN algorithm. The …
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Late Neogene Uplift of the Fairweather Ground on the Basis of Bathymetric and Seismic Data from the Gulf of Alaska
… on the Yakutat microplate and 2) interpret the Transition fault as an active thrust to oblique thrust fault.</p>
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Late Cenozoic Exhumation in a Transpressional Setting: Fairweather Range, Alaska
… of the Yakutat terrane as margin-parallel motion transitions to subduction. Recent studies have shown that deformation in the St. Elias orogen, at the northern end of the terrane, accommodates a large portion of convergence, but deformation at the eastern and southern margins remains more poorly …
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VALIDATION OF CIRCUIT TIMING BEHAVIOR IN THE PRESENCE OF DELAY DEFECTS AND NBTI AGING
… and interconnect. The traditional stuck-at, and transition fault model are not appropriate to model such defects. They must be tested appropriately by targeting critical paths in the circuit. Furthermore, reliability issues such as Negative Bias Temperature Instability (NBTI) and Hot carrier …
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ATPG and DFT Algorithms for Delay Fault Testing
… and the difficulty in achieving very high fault coverage. Scan-based delay testing, which could ensure a high delay fault coverage at reasonable development cost, provides a good alternative to the at-speed functional test. This dissertation addresses several key challenges in scan-based …
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Brittle-viscous deformation cycles at the base of the seismogenic zone in the continental crust
… at different scales of a brittle-viscous fault zone active at the base of the seismogenic crust. Object of analysis are samples from the sinistral strike-slip fault zone BFZ045 from Olkiluoto (SW Finland), located at the site of a deep geological repository for nuclear waste. Combined …