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Showing 1 to 1 of 1 for “"thin film refractive index"”.
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Investigation of Non-DLVO Forces using an Evanescent Wave Atomic Force Microscope
… absolute separation between surfaces and/or the refractive index as a function of separation in AFM measurements. This technique is known as evanescent wave atomic force microscopy (EW-AFM). The scattering of an evanescent wave by Si3N4 AFM tips is large and decays exponentially with separation …