Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
Results
Showing 1 to 20 of 88 for “"test equipment"”.
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The design and construction of test equipment for a regenerative
Thesis: B.S., Massachusetts Institute of Technology, Department of Mechanical Engineering, 1953
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Design and prototype fabrication of a manipulator for semiconductor test equipment
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1996.
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Roadmap of mechanical systems design for the semiconductor automatic test equipment industry
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1998.
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An analysis of revenue and product planning for automatic test equipment manufacturers
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
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A data-driven approach to improving capacity utilization of semiconductor test equipment
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996.
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The allocation of automated test equipment capacity with variability in demand and processing rates
The purpose of this thesis is to develop a model for allocating the Consolidated Automated Support System (CASS) to the intermediate repair sites. The model uses integer, linear, and nonlinear programming (optimization) to determine the approximate number of CASS stations at a site based on demand, …
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Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies
Methods for Extending High-Performance Automated Test Equipment (ATE) using Multi-Gigahertz FPGA Technologies Ashraf M. Majid 264 Pages Directed by Dr. David Keezer This thesis presents methods for developing multi-function, multi-GHz, FPGAbased test modules designed to enhance the performance …
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Understanding and controlling risk in product development, specifically in new technology procurement, at an automatic test equipment manufacturer
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.
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The investigation of the effect of free organic anions on scale inhibitors used to prevent nucleation occurring in oil rig wells, using dynamic test equipment.
… organic anions effect on scale inhibitors was tested using a dynamic test rig called the P-MAC. The scaling ion solutions were ran through a heated coil and they scale up causing a restriction of the coil. The restriction caused a change in the differential pressure across the coil. In this way …
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The engineering case study as a basis for the Master of Science thesis : the Teradyne, Inc. case study : a kinematic interface for semiconductor test equipment
… completed at Teradyne, Inc., a semiconductor test equipment manufacturer. Advantages of the proposed Master's program to the student and to industry are discussed, as are potential uses of the resultant Engineering Case Study in the classroom and in industry.
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Product strategy in response to technological innovation in the semiconductor test industry
… semiconductor industry demanded greater cost of test economics in semiconductor test equipment. In response to the changes in the industry and the customer demands, the semiconductor test industry segmented itself into two broad strategies. Typically, the large semiconductor test equipment …
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Automated power supply testing
… possible the process operator-independent. The testing stage must clearly be a reliable and fast process. This project presents an Automated Testing system used to test a switched mode power supply. It includes all the basic principles found in industrially available Automatic Test Equipment …
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Development of a Micromechanical Modeling Approach to Predict Asphalt Mixture Stiffness Using the Discrete Element Method
… in the design and optimization of physical test equipment such as hollow cylinder tensile tester. In addition, tensile strength simulations and creep stiffness prediction are also very promising by using the MDEM approach.
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Design and implementation of a digital real-time secondary surveillance radar/identification friend or foe target emulator
A real live test involving such a large number of targets would be extremely expensive, and difficult to repeat. There is thus a need for specialized target emulators to be developed and used as laboratory test equipment. This thesis describes the design and implementation of a …
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A comparative study of high voltage analog switch topologies
… improve. They have application in automated test equipment, variable gain feedback amplifiers, sample and hold circuits, and other switched capacitor circuits. In this document, four high voltage analog instrumentation switches were designed using different topologies. The four switches were …
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Operational improvements in a factory of low volume and high mixture
… for the assembly area of a semiconductor equipment manufacturer. High complexity and customization of machines and a low and fluctuating volume are typical challenges within the company. The aim of the research is to improve key metrics for operational improvements. These include lead time …
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Tribological evaluation of unlubricated and marginally lubricated bearing materials
… range of load and speed using a thrust washer test apparatus and pin on disc test equipment.
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Design and Analysis of a Transformer-Based Solid-State Relay
Automatic Test Equipment (ATE) systems require relays to perform complex high-speed tests on semiconductor devices. However, existing relays all come up short in some aspect. Electromechanical reed relays have a limited lifetime and slow switching speeds, while solid-state photoMOS relays have high …
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Linearity and monotonicity of a 10-bit, 125 MHz, segmented current steering digital to analog converter
… TLV5651, 10-bit, 125 MHz communication DAC. Testing was conducted at the Texas Instruments facility on Forest Lane, Dallas, Texas. Texas Instruments provided test equipment, software and laboratory space to obtain test data. Analysis of the data found the DAC to be monotonic since the …
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