Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 5 of 5 for “"system-level electrostatic discharge (ESD)"”.
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Enhanced modeling methodology for system-level electrostatic discharge simulation
To enable accurate system-level electrostatic discharge (ESD) simulation, models for the equipment under test, the ESD source, and the environment are required. This work presents advanced modeling methods for the ESD source, the victim IC, and other on-board components, most notably the transient …
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Characterization and modeling of ESD events and near-field scanning calibration structures
… that cover, two major topics. The first topic, system-level electrostatic discharge (ESD), is discussed over the course of two papers. The second topic, a calibration structure for near-field scanning probe calibration application, is discussed in the last paper. In the first paper, …
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Failures caused by supply fluctuations during system-level ESD
It is necessary to design robust electronic systems against system-level electrostatic discharge (ESD). In additional to withstanding ESD without hard failures (permanent damage), it is important that the system is robust against soft failures (recoverable loss of function or data), which can be …
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Understanding, modeling, and mitigating system-level ESD in integrated circuits
… several studies regarding the effects of system-level electrostatic discharge (ESD) and how to model and mitigate them. The topics in this dissertation fall into two broad categories: modeling pieces of a system-level ESD test setup and phenomenological studies. Simulation is an important …
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Logic upset induced by substrate current during power-on ESD
… possible soft failure mechanism during power-on electrostatic discharge (ESD). For contact discharge into a test chip mounted on a board, logic upsets can be triggered by a parasitic NPN structure which couples the ESD protection to an N+ diffusion in the core circuitry. This type of upset often …