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Showing 1 to 1 of 1 for “"streuende Nahfeldmikroskopie"”.
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Scattering Scanning Near-Field Optical Microscopy on Anisotropic Dielectrics
Near-field optical microscopy allows the nondestructive examination of surfaces with a spatial resolution far below the diffraction limit of Abbe. In fact, the resolution of this kind of microscope is not at all dependent on the wavelength, but is typically in the range of 10 to 100 nanometers. On …