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Showing 1 to 1 of 1 for “"silicon crystal defect characterization"”.
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Design and Study of an Electron Beam System for Silicon Recrystallization
… in semiconductor technology. Technologies like Silicon-On-Insulator (SOI) can be used for the individual layers of a 3D-IC. 3D-ICs offer the potential to create more compact and powerful devices, which can be beneficial for fabricating advanced multi-core CPUs and intelligent high-performance …