NDLTD logo NDLTD Union Catalog and Global ETD Search

Global ETD Search

Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.

Results

Showing 1 to 20 of 66 for “"secondary electron"”.

  1. Secondary Electron Emission of Liquid Insulators

    Erin, TimUniversity of Illinois at Urbana-Champaign2014

    Made available in DSpace on 2014-12-08T22:24:45Z (GMT). No. of bitstreams: 1 7013299.pdf: 2113801 bytes, checksum: 73ae609c90132eab607f6518c534e29f (MD5) Previous issue date: 1969

    uiuc Repository record

  2. Secondary Electron Multiplication in Microwave Field

    Fang, Frank FuUniversity of Illinois at Urbana-Champaign2014

    Made available in DSpace on 2014-12-04T21:03:08Z (GMT). No. of bitstreams: 1 5904508.pdf: 3943748 bytes, checksum: f4e0e3ce8238eb913d3c9046730729ea (MD5) Previous issue date: 1959

    uiuc Repository record

  3. Measurement of Angle-Resolved Secondary Electron Spectra

    Davies, Robert

    utahstate Repository record

  4. The Time Dispersion of Secondary Electron Emission

    Ernst, Edward WillisUniversity of Illinois at Urbana-Champaign2014

    Made available in DSpace on 2014-12-04T21:02:43Z (GMT). No. of bitstreams: 1 0011504.pdf: 4327321 bytes, checksum: 243e5582e982761d86a45d5e21eb4e49 (MD5) Previous issue date: 1955

    uiuc Repository record

  5. Encapsulated source contact dose estimates incorporating secondary electron emission

    Cleary, JamesUniversity of Ontario Institute of Technology2015

    Secondary electron emission generated at the surface of thin material from interaction with gamma rays form a significant component of the surface dose. The intensity of this emission is known to vary with material composition and incident radiation energies. The goal of this research effort is to …

    uoit Repository record

  6. SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS

    HAN WEIDING2019

    The scanning electron microscope (SEM) is a powerful high resolution imaging instrument used in multiple fields of study today. The low energy scattered electrons inside it, used mainly for topographic image of a sample’s surface, contain valuable information in the emitted energy spectrum. In this …

    nus Repository record

  7. Measurements of Secondary Electron Yield from Low-Energy Ion Interactions With Gas Covered Surfaces

    Hu, Bozhao2017

    Made available in DSpace on 2017-07-06T18:48:38Z (GMT). No. of bitstreams: 3 Hu_Bozhao_MS.pdf: 99116701 bytes, checksum: 67272fada3cf5d1c798b37d3a385c992 (MD5) Hu_Bozhao_MS_ABS.pdf: 638832 bytes, checksum: 6a854d3d50627da8e1f9a753adec3096 (MD5) license.txt: 4813 bytes, checksum: …

    uiuc Repository record

  8. The Role of Bandgap in the Secondary Electron Emission of Small Bandgap Semiconductors: Studies of Graphitic Carbon

    Nickles, Neal E.

    utahstate Repository record

  9. Theoretical and experimental secondary electron spin polarisation studies and 3D theory of field emission for nanoscale emitters

    Masur, SabrinaUniversity of Cambridge2021

    Spin-polarised electron beams are an invaluable probe of spin-dependent phenomena in fields of atomic and molecular physics, magnetism and biophysics. For this purpose, this work explores both theoretical and experimental aspects of field emission properties of point-like nano-scale emission …

    cambridge Repository record

  10. Interaction cross sections needed for simulation of secondary electron emission spectra from thin metal foils after fast proton impact

    Travia, AndersonEast Carolina University2009

    Monte Carlo simulations of secondary electron emission from thin metal foils after fast proton impact require reliable interaction cross sections with the target under consideration. Total and energy differential inelastic cross sections have been derived for aluminum, copper, and gold thin-metal …

    ecu Repository record

  11. A Study of High Energy-Resolution and at Low Primary Energies of the Secondary Electron Emission From (100) Tungsten

    Piper, Thomas ClaytonUniversity of Illinois at Urbana-Champaign2015

    Made available in DSpace on 2015-05-12T21:41:39Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 6706698.PDF: 3471754 bytes, checksum: 55771bb48e63d8dd7ed8d16ef08a4168 (MD5) Previous issue date: 1966

    uiuc Repository record

  12. Examination of secondary electrons generated by encapsulated gamma sources to improve contact dosimetry estimates

    Heritage, EricUniversity of Ontario Institute of Technology2017

    Secondary electron generation on the surface of encapsulated gamma sources can play a large role in the dose measured near the surface of the encapsulation. The National Council on Radiation Protection and Measurements (NCRP) Report - 40 contains contact dose rate conversion factors for …

    uoit Repository record

  13. Anode Materials for High Power Microwave Devices

    Gortat, Daniel PiotrUniversity of Cambridge2020

    … HPMs can significantly upset or even destroy electronic devices within military and commercial systems prompting applications for nonlethal directed energy weaponry. Cathodes and anodes are the two critical components and the engine of the HPM which makes this application possible. The decay …

    cambridge Repository record

  14. Radio frequency driven direct current electron beam source

    Shaw, Denis M., author, Collins, George, advisorColorado State University. Libraries2007

    A new type of electron beam source employing ion-induced secondary electron emission from cold cathodes is developed for feature charge neutralization during plasma etching. A low pressure (approximately 2 – 20 mTorr) inductively coupled plasma provides ions which impinge on a high secondary …

    colostate Repository record

  15. Observation of plasma sheath modulation in the plasma bipolar junction transistor

    Houlahan, ThomasUniversity of Illinois at Urbana-Champaign2012

    … model developed herein, a 359% increase in the secondary electron emission coefficient of the exposed silicon surface is inferred. Additionally, the pressure dependence of these devices is explored, with the data suggesting that smaller devices would exhibit both faster switching and higher …

    uiuc Repository record

  16. Emitting Wall Boundary Conditions in Continuum Kinetic Simulations: Unlocking the Effects of Energy-Dependent Material Emission on the Plasma Sheath

    Bradshaw, Kolter AustenVirginia Tech2024

    … the plasma sheath forms and regulates the electron and ion fluxes into the material. Emission from the material has the potential to change sheath structure drastically, and must be modeled rigorously to produce accurate predictions of the fluxes into the wall. Continuum kinetic codes offer …

    vt Repository record

  17. Low-voltage spatial-phase-locked scanning-electron-beam lithography

    Cheong, Lin LeeMassachusetts Institute of Technology2010

    Spatial-phase-locked electron-beam lithography (SPLEBL) is a method that tracks and corrects the position of an electron-beam in real-time by using a reference grid placed above the electron-beam resist. In this thesis, the feasibility of spatial-phase-locked lowvoltage electron-beam lithography is …

    mit Repository record

  18. The Effects Of Electrode Geometry On Current Pulse Caused By Electrical Discharge Over An Ultra-fast Laser Filament

    Bubelnik, Matthew

    … We attribute these additional features to secondary electron collisional ionization brought about by field enhancement at the tips. Additional discrepancies in the currents measured leaving the high-voltage electrode and that returning to ground were also observed. Implications for …

    ucf

  19. Ion flux maps and helicon source efficiency in the VASIMR VX-100 experiment using a moving Langmuir probe array

    Olsen, Christopher ScottRice University2009

    … to pulse in an effort to find optimal settings. Secondary electron emission was found to be an important factor that artificially enhanced the measured flux at large negative bias voltages. The most accurate bias voltages were found to be around -20 volts where the flux enhancing effects were …

    rice Repository record

  20. Monte Carlo Simulations of Electron Transport in 3D Solids and Molecular Dynamics Simulations of the Mechanics of 2D materials

    Azzolini, MartinaUniversità degli studi di Trento2019

    The aim of this thesis is the study of electronic transport and mechanical properties of materials using computer simulations. In particular, we dealt with the charge transport in semiconduc- tor and metallic samples and with the peeling of a graphene layer from bulk graphite. The computational …

    trento Repository record

Page 1 of 4